Preliminary
S3C2451X RISC MICROPROCESSOR
USB2.0 DEVICE
17-11
Preliminary product information describe products that are in development,
for which full characterization data and associated errata are not yet available.
Specifications and information herein are subject to change without notice.
TEST REGISTER (TR)
The test register is used for the diagnostics. All bit are activated when 1 is written to and is cleared by 0 on them.
Bit[3:0] are for the high speed device only.
Register Address
R/W
Description
Reset
Value
TR 0x4980_0018
R/W
Test
Register
0x0
TR Bit
R/W
Description
Initial
State
[31:5]
Reserved
TMD [4]
R/W
Test
Mode.
When TMD is set to 1. The core is forced into the test mode.
Following TPS, TKS, TJS, TSNS bits are meaningful in test
mode.
0
TPS [3]
R/W
Test
Packets.
If this bit is set, the USB repetitively transmit the test
packets to Host.
The test packets are explained in 7.1.20 of USB 2.0
specification.
This bit can be set when TMD bit is set.
0
TKS
[2]
R/W
Test K Select.
If this bit is set, the transceiver port enters into the high-
speed K state.
This bit can be set when TMD bit is set.
0
TJS
[1]
R/W
Test J Select.
If this bit is set, the transceiver port enters into the high-
speed J state.
This bit can be set when TMD bit is set.
0
TSNS
[0]
R/W
Test SE0 NAK Select
If this bit is set, the transceiver enters into the high speed
receive mode and must respond to any IN token with NAK
handshake.
This bit can be set when TMD bit is set.
0