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NUC970 Technical Reference Manual
Publication Release Date: Dec. 15, 2015
- 1137 -
Revision V1.30
NUC97
0
T
E
CHNIC
A
L
RE
F
E
RE
N
CE
MA
NUA
L
Test Mode Control Register (VA_TEST)
Register
Offset
R/W
Description
Reset Value
VA_TEST
0x34
R/W
Test Mode Control Register
0x0000_0000
31
30
29
28
27
26
25
24
SIGN_DATA [15:8]
23
22
21
20
19
18
17
16
SIGN_DATA [7:0]
15
14
13
12
11
10
9
8
Reserved
BistFail
BistFinish
BistEn
7
6
5
4
3
2
1
0
SIGN_BUSY
Reserved
TEST_GARY
SIGN_SELF SIGN_PRESET
SIGN_SRC
SIGN_ON
Bits
Description
[31:16]
SIGN_DATA
A 16-bit Value Specifies Signature Data (Read Only)
[15:12]
Reserved
Reserved.
[11:10]
BistFail
The BistFail indicates if the BIST fails or succeeds If the value of BistFail is 2’b00 at the end,
the embedded SRAM pass the BIST test, otherwise, it is faulty.
[9]
BistFinish
The Finish indicates the end of the BIST operation When BIST controller finishes all
operations, this bit will be set to one Clearing BistEn also cause this bit to be reset.
[8]
BistEn
The BistEn is used to enable the BIST operations.
[7]
SIGN_BUSY
Signature Analyzer Status (Read Only)
0 = Signature analyzer Idle.
1 = Signature analyzer Busy.
[6]
Reserved
Reserved.
[5]
TEST_GARY
It is necessary to fix at “0” for normal operation.
[4]
SIGN_SELF
Signature Analyzer Self Test
0 = Disable.
1 = Enable.
[3]
SIGN_PRESET
Preset Signature Analyzer Operation
0 = Preset signature Value when analysis begins.
1 = Do not preset.
[2:1]
SIGN_SRC
Signature Analyzer Data Source Select
00 = Null (Zero Input).
01 = R data.
10 = G data.
11 = B data.