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6.6.2.4. Using the SESI detector (optional)
The SESI detector allows the acquisition of FIB secondary ion images and electron images.
The following table should serve as a help to find the required settings for your application.
Procedure
1
On the right side of the toolbar, from the drop-down list select an imaging mode, e.g.
FIB
mode SEM
.
2
Select the
SESI
detector.
The SESI detector is operated in
SE mode
.
3
In order to toggle between
SE Mode
and
Ion
mode
, tick/untick the
ION Mode
checkbox.
4
To set the collector bias, move the
Collector
Bias
slider.
Operating
mode
Detected
signals
FIB mode
EHT
Typical
WD
Detector settings
SE mode
Secondary
electrons
SEM
100 V to 30
kV
max. 5 mm
Collector voltage: 0 V to + 1500 V
Best detection: +300 V to + 400 V
FIB
2 kV to 30 kV
coincidence point
Collector voltage: 0 V to + 1500 V
Best detection: +300 V to + 400 V
Ion mode
Secondary
ions
FIB
2 kV to 30 kV
coincidence point
Collector voltage: - 4 kV to 0 kV
Best detection: around - 4 kV
Summary of Contents for Crossbeam 340
Page 1: ...Crossbeam 340 Crossbeam workstation Instruction Manual ...
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Page 130: ...NPM çÑ NPQ fåëíêìÅíáçå j åì ä êçëëÄÉ ã PQM ÉåMOE loF NPK aÉÅä ê íáçå çÑ ÅçåÑçêãáíó ...
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