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Before the electron beam exits the objective lens (
6
), the electrostatic lens creates an opposing
field which reduces the potential of the electrons by + 8 kV. The energy of the electrons reaching
the specimen surface therefore corresponds to the set acceleration voltage (EHT).
Signal detec-
tion
When the primary electron beam hits the specimen, certain interaction products are released,
which can be recorded by specific detectors.
3.3.3. Imaging modes
The following imaging modes are available:
Imaging mode
FIB Mode..
Characteristics
Typical application
SEM imaging
SEM
Electron beam is active,
ion beam is blanked.
The SE signal is synchronised
to the SEM scan.
High resolution FESEM
Summary of Contents for Crossbeam 340
Page 1: ...Crossbeam 340 Crossbeam workstation Instruction Manual ...
Page 24: ...OQ çÑ NPQ fåëíêìÅíáçå j åì ä êçëëÄÉ ã PQM ÉåMOE loF OK p ÑÉíó p ÑÉíó ÉèìáéãÉåí ...
Page 60: ...SM çÑ NPQ fåëíêìÅíáçå j åì ä êçëëÄÉ ã PQM ÉåMOE loF RK fåëí ää íáçå ...
Page 120: ...NOM çÑ NPQ fåëíêìÅíáçå j åì ä êçëëÄÉ ã PQM ÉåMOE loF UK qêçìÄäÉëÜççíáåÖ mçïÉê ÅáêÅìáí ...
Page 126: ...NOS çÑ NPQ fåëíêìÅíáçå j åì ä êçëëÄÉ ã PQM ÉåMOE loF NNK ÄÄêÉîá íáçåë ...
Page 130: ...NPM çÑ NPQ fåëíêìÅíáçå j åì ä êçëëÄÉ ã PQM ÉåMOE loF NPK aÉÅä ê íáçå çÑ ÅçåÑçêãáíó ...
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