Tektronix TCPA300 SERIES, Instruction Manual

Page: 201 / 205

TCPA300/400 Amplifiers and TCP300/400 Series Current Probes Instruction Manual
Glossary- 1
Glossary
amp-second product
The unit of measure defining the maximum amount of pulsed current that
can be measured before the probe core becomes saturated. The amp-second
rating applies only to measurement values between the maximum continuous
and maximum pulse current ratings of the probe. The amp-second rating is
equal to the peak current multiplied by the pulse width at the 50% point.
auto-balance
A process that removes unwanted DC offsets from the TCPA300 and
TCPA400 circuitry to ensure maximum measurement accuracy. This process
is performed during the probe degauss routine.
bucking current
Current fed back by the TCPA300 and TCPA400 to the current probe during
DC and low-frequency AC measurements. Bucking current nulls most of the
magnetic field in the probe core, allowing linear DC and AC measurements
simultaneously.
conventional current flow
The flow of the positive charge in a conductor. Conventional current flow is
from positive to negative. The arrows on current probes point in the direction
of conventional current flow. Conventional current flow is in the opposite
direction of
electron current flow
.
degauss
A process of eliminating residual magnetism from the probe core by feeding
a decaying sine wave into the core. The degaussing process should be
performed before clamping the probe around a conductor, whenever the
probe becomes saturated by current overloads, or whenever the probe is
exposed to a magnetic field. The term is derived from one of the units of
magnetic flux density.
electron current flow
The flow of the electrons in a conductor. Electron current flow is from
negative to positive. The arrows on current probes point in the opposite
direction of electron current flow. Electron current flow is in the opposite
direction of
conventional current flow
.
flux
The density of a magnetic field. As the number of flux lines increases, the
magnetic field strength increases. Current in the conductor under test
generates flux lines in the probe core by inducing a voltage in the core.