The timing diagram in Figure 39 shows the relationship between the
Test-n Delay
Time
setpoint on the
Setup>Protection>General Profile n>Testing After Initial Trip
screen, the
Test TCC Hold Time
, and the
Test Delay Time
setpoints.
IR 4
IR 3
IR 2
IR 1
Closed
Open
P-TCC
Shift TCC
Closed
Open
P-TCC
Shift TCC
Closed
Open
P-TCC
Shift TCC
Closed
Open
P-TCC
Shift TCC
TnDT
TTHT
TnDT
TDT
TTHT
TnDT
No volt TDT
TTHT
TnDT
No volt No volt
TDT
TTHT
Trip using
Shift TCC
time
Legend:
TnDT = Test-n Delay Time TTHT = Test TCC Hold Time
TDT = Test Delay Time
P-TCC = Previous TCC
Figure 39. The timing example for the PulseFinding technique with the TCC Shifting; the margin
setting is not accounted for.
Test Delay Time
This is the amount of time testing is delayed after the
Good Source Voltage Indication
threshold has been met. This time applies to all test sequences. (Range: 0.3-300.1;
Step: 0.1; Default: 0.9)
Trip on Test Sequence TCC Low Cutoff
(Applies to both directions for this profile)
When checked, the
TCC Shifting
function performs an instantaneous trip whenever
the fault current reaches the
Minimum Trip Level
setting of any configured element
for the active Test Sequence TCCs before the
Test TCC Hold Time
setting expires.
The
For Close Operations
and the
For Pulse Operations
settings (see Figure 38 on
page 54) are all valid for the
Trip on Test Sequence TCC Minimum Pickup
function.
The Low Current Cutoff of the resulting TCC is the
Instantaneous Trip Level
setting
for the
Test TCC Hold Time
setting. When the Low Current Cutoff of the resulting TCC
is set to “N/A,” the Minimum Trip Level of the resulting TCC becomes the Instantaneous
Trip Level.
S&C Instruction Sheet 766-530 55
Protection Setup