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Service Maintenance
Diagnostics_________________________________________________________________
5-28
___________________ LCQ Deca XP Plus Hardware Manual ________________
5.5 Diagnostics
Many of the MS detector components can be tested by the Tune Plus
diagnostics. You should replace XP Plus components when indicated by the
Tune Plus diagnostics.
The XP Plus diagnostics is used to test the major electronic circuits within the
instrument and indicate whether the circuits pass or fail the tests. If there is a
problem with the instrument electronics, the Tune Plus diagnostics can often
locate the problem. You can then often correct the problem by replacing a
faulty PCB or assembly.
The Tune Plus diagnostics does not diagnose problems that are not electrical
in nature. For example, it does not diagnose poor sensitivity due to
misaligned or dirty components or to improper tuning. Therefore, it is
important to have someone who is familiar with system operation and basic
hardware theory run the diagnostics and use it to assist in isolating any
problems.
Before running the diagnostics, consider the following:
•
Did the system fail when you were running samples?
•
Did problems occur after you performed maintenance on the instrument,
data system, or peripherals?
•
Did you change the system’s configuration, cables, or peripherals just
before the problem occurred?
If the answer is yes to the first item above, there is the possibility of a
hardware failure, and running the diagnostics is appropriate.
If the answer is yes to one of the last two items above, the problem is probably
mechanical, not electrical. Verify that alignment, configurations, and cable
connections are correct before you run the Tune Plus diagnostics.
To run the Tune Plus diagnostics, proceed as follows:
1. Tune the ring electrode and quadrupole/octapole RF voltages as described
in the topic Tuning the Ring Electrode and Quadrupole/Octapole RF
Voltages on page 5-16.
2. In the Tune Plus window, choose
Diagnostics | Diagnostics
. The
Diagnostics dialog box appears. See Figure 5-11.
3. Select one of the following options. Refer to Table 5-3.
•
To test all of the electronic subsystems (that is, the vacuum system,
power supplies, lenses, ion detection system, and RF voltage
electronics), click on the All tab and select the Everything check box.
•
To test an individual subsystem, click on the tab corresponding to that
subsystem and select the appropriate options.
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