Kikusui TOS9200, Руководство по эксплуатации

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TOS9200/9201 Basic Operations 3-51
If the lo wer judgement function is on, the test ends with a F AIL judgement when the
tester detects a current lar ger than the upper current or a current smaller than the
lo wer current. After a fe w milliseconds, the po wer is then cut of f.
When lo wer and upper judgements are made, “ ↓ F AIL” and “ ↑ F AIL” appear ,
respecti v ely , at the top right of the LCD.
At the same time, the F AIL LED lights on the indicator and a b uzzer sounds. T o
cancel the F AIL judgement, press the ST OP switch (the F AIL judgement is output
until the ST OP switch is pressed).
The measurement results are displayed until the ST OP switch is pressed.
The F AIL judgement other than that described abo v e is a CONT A CT F AIL (“
→←
F AIL”) judgement that is made when the contact f ailure is detected while a scanner
is used.
• In A C withstanding v oltage testing, a lo wer judgement is not made during a v olt -
age rise time (RISE TIME) or a v oltage f all time (F ALL TIME).
• In DC withstanding v oltage testing, no lo wer judgement is made during a v oltage
rise time (RISE TIME).
• In DC withstanding v oltage testing, an upper judgement is not made until the
W AIT TIME has elapsed to eliminate the ef fects of a char ge current in capaciti v e
DUTs.
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Insulation resistance testing
If the upper judgement function is on, the test ends with a F AIL judgement when a
resistance lar ger than the upper resistance is detected. After a fe w milliseconds, the
po wer is then cut of f.
If the lo wer judgement function is on, the test ends with a F AIL judgement when the
tester detects a resistance smaller than the lo wer resistance. After a fe w millisec -
onds, the po wer is then cut of f.
Using a lo wer and upper judgement, “
↓
F AIL” and “
↑
F AIL” appear , respecti v ely ,
at the top right of the LCD. At the same time, the F AIL LED lights up on the indica -
tor and a b uzzer sounds.
T o cancel the F AIL judgement, press the ST OP switch (the F AIL judgement is out -
put until the ST OP switch is pressed).
The measurement results are displayed until the ST OP switch is pressed.
The F AIL judgement other than that described abo v e is a CONT A CT F AIL (“
→←
F AIL”) judgement that is made when the contact f ailure is detected while a scanner
is used.
• In insulation resistance testing, an upper judgement is not made during a v oltage
rise time (RISE TIME).
• In insulation resistance testing, a lo wer judgement is not made until the W AIT
TIME has elapsed to eliminate the ef fects of a char ge current in capaciti v e DUTs.
NOTE
NOTE