Kikusui TOS9200, Руководство по эксплуатации

Страница: 52 / 172

3-14 Basic Operations TOS9200/9201
The current detection response can be set using the SHIFT + F2 keys (RESPONSE),
regardless of the location of the cursor. Each time the SHIFT + F2 keys are pressed,
the selection is switched among SLOW, MID, and FAST, in order.
Using the keys, move the cursor to the right of the current detection
response (RESPONSE), and make settings using the rotary knob.
Turn the rotary knob clockwise : SLOW
→
MID
→
FAST
Turn the rotary knob counterclockwise : FAST
→
MID
→
SLOW
■
SLO W
In the SLO W mode, a current is detected at an inte grated time constant of approxi -
mately 40 ms in response to the mean v alue. This is equi v alent to the current-detec -
tion response of Kikusui’ s general-purpose A C withstanding v oltage tester . This
setting complies with the dielectric breakdo wn detection de fi ned in the safety stan -
dards, and can be used to conduct withstanding v oltage testing of ordinary electric
de vices and electronic components.
• According to the safety standard (IEC60950 1999), “dielectric breakdo wn is
re g arded to ha v e occurred when, as a result of the application of a test v oltage, the
fl o wing current sharply increases be yond control, that is, it becomes impossible to
maintain the fl o wing current belo w a certain le v el. Coronal dischar ge or instanta -
neous fl asho v er is not re g arded as dielectric breakdo wn. ” In accordance with this
standard, Kikusui’ s general-purpose A C withstanding v oltage tester mak es a F AIL
judgement for a test if the tester , ha ving a mean-v alue-responsi v e current-detec -
tion circuit, detects a current abo v e the upper current (UPPER) fl o wing into a
DUT .
■
MID , F AST
MID and F AST , with inte grated time constants of approximately 4 ms and 0.4 ms,
respecti v ely , detect currents in response to the mean v alue, similarly to peak detec -
tion. These tw o modes respond more quickly than the SLO W mode, making them
suitable for the detection of an instantaneous dischar ge, as well as a dischar ge con -
taining high-frequenc y elements. Due to their e xcellent ability to detect the upper
current, the y are ef fecti v e in withstanding v oltage tests on DUTs that are prone to
dielectric breakdo wn, such as small electronic de vices. Ho we v er , the tw o modes are
not al w ays useful in repeatable withstanding v oltage tests, as the y detect e v en a
minimal dischar ge.
• Ev en in the F AST mode , minimal discharges are sometimes not detected.
This tester is designed f or conducting withstanding v oltage tests on elec -
tr ic de vices and electronic components under a saf ety standard. It has a
tr ansf or mer capacity of 500 V A with a shor t-circuit current of 200 mA.
Theref ore , the tester ma y destro y some types of electronic components
such as small rela ys and semiconductors , e v en if the tester is capab le of
detecting dielectr ic breakdo wns b y monitor ing an o v ercurrent.
NOTE
CAUTION