HP 54645A, Руководство пользователя и сервисное руководство

Страница: 295 / 301

sensing, 2–23
tip design, 4–40
probe cable, 1–11 to 1–12
probe calibrator
performance characteristics, 9–9
probe leads
removing from cable, 1–12
probes
connect grabbers, 1–11 to 1–12
short together, 1–11 to 1–12
probing
circuit under test
practices, 4–42
problems
obtain HP service, 7–4
solving, 7–3
trace display, 7–4 to 7–5
with channels, 7–5 to 7–6
procedures
to test threshold accuracy, 7–12
to verify correct operation, 7–2
pulse
measurements, 5–28 to 5–31
sync, 6–7
pulse parameters
See time measurements
R
rackmount kit, 1–7
re-ordering channels, 2–26
Readout cursor key, 5–22
rearming trigger, 4–34
recall
trace memory, 4–43
Recall Setup softkey, 4–46
recall waveforms, 4–46 to 4–47
recover screen, 4–21
removing
cabinet, 8–4
display, 8–6
fan, 8–4
front panel, 8–5
handle, 8–9
keyboard, 8–9
power supply, 8–8
system board, 8–6
removing probe leads, 1–12
repetitive waveforms
and edge trigger, 3–12
replaceable parts, 8–2
descriptions and part numbers, 8–14
exploded view, 8–13, 8–16
list, 8–14
list for oscilloscopes, 8–14
mail order, 8–12 to 8–17
ordering, 8–12 to 8–17
reset setup, 4–48 to 4–50
resetting the oscilloscope, 7–4
resistance of impedance, 4–39 to 4–42
resistors
for test connectors, 7–9 to 7–10
reversing Autoscale, 2–18 to 2–19
ribbon cable
disconnect to remove display, 8–6
disconnect to remove front panel, 8–5
disconnect to remove power supply, 8–8
disconnect to remove system board, 8–6
Right
time reference position, 4–22 to 4–28
ringing in voltage model, 4–41
rise time in voltage model, 4–41
rise time measurement, 5–28
RiseTime softkey, 5–30
Roll display mode, 5–13
RS-232 Interface module, 4–43
run
and Erase, 4–38
Run key, 2–28
self-tests, 7–11
S
sampling
period, 2–13
sampling period, 2–14
sample rate display, 2–27
save
configuration, 4–44
setups, 4–48
waveforms, 4–46 to 4–47
Save to softkey, 4–46
screen
erasing, 4–38
recovering, 4–21
SECAM, 6–4, 6–6, 6–11
select knob, 2–26, 3–17
choosing edge trigger channel, 3–16
using to select channels, 2–24
selecting
channels, 2–24, 2–26
channels for pattern trigger, 3–17
time reference position, 4–22 to 4–28
self-calibrations, 7–33 to 7–34
self-tests
acquisition system, 7–11
sequential output patterns
triggering on, 3–23
setting
pattern trigger, 3–17
DC offset for threshold test, 7–14
function generator, 7–13
oscilloscopes, 1–4
settings
default configuration, 4–48
for graticule, 2–33
setup
factory default, 2–18 to 2–19
message, 10–7
reset, 4–48 to 4–50
setup functions
performance characteristics, 9–9
setup memory, 4–43 to 4–44
setup saving, 4–48
shipment, damaged
See damaged shipment
shorting probes, 1–11 to 1–12
Show Meas softkey, 5–27, 5–29
signal
noise, 5–6, 5–10
single, 4–33
and auto trigger, 3–4
event, 4–34 to 4–35
trigger, 4–34
single-shot
acquisition, 3–4, 4–33
bandwidth, 4–35
smoothing, 5–10
softkey
See keys listed by name
softkeys
Adv, 3–19 to 3–24
edge trigger, 3–16
Edit Label, 4–46
Label, 4–53 to 4–58
Logic levels, 4–51 to 4–52
Index
Index-6