HP 54645A, Руководство пользователя и сервисное руководство

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non-volatile settings
label list, 4–56
non-volatile setup memory, 4–44
NTSC, 6–4, 6–6, 6–10 to 6–11
O
odd field, 6–10 to 6–11
On/Off
"Off" channels, 2–24
measurements and channels, 2–24
operation of Autoscale, 2–20
operators
for trigger, 3–19 to 3–24
Option 005, 6–2
characteristics, 9–11
triggering, 6–5
troubleshooting, 7–52
optional accessories, 1–7
order of channels, 2–26
ordering new assemblies, 8–11 to 8–17
oscilloscope, 1–2
accessories supplied with, 1–5 to 1–9
configuration preset, 4–48 to 4–50
configure with Autoscale, 2–18
configuring with Autoscale, 2–19
deep memory, 5–3
performance characteristics, 9–2
preset configuration, 4–48
resetting, 7–4
starting acquisition, 2–28
stopping acquisition, 2–28
using, 1–2
oscilloscopes
accessories supplied with, 1–6
BenchLink for Microsoft Windows, 1–7
carrying case for, 1–7
circuit probing concepts, 4–39 to 4–42
connect to test threshold, 7–13
controls, 2–6
does not display ringing, 4–41
functional controls, 2–6
making measurements, 4–2
messages, 10–2
optional accessories, 1–7
preparing for use, 1–4
process of using, 1–3
removing power supply, 8–8
removing system board, 8–6
removing the cabinet, 8–4
removing the display, 8–6
removing the fan, 8–4
removing the front panel, 8–5
removing the handle, 8–9
removing the keyboard, 8–9
replaceable parts, 8–2
setup, 1–4
test channel thresholds, 7–14
testing and troubleshooting, 7–2
view of parts, 8–13, 8–16
oversampling technique, 5–10
overview
advanced trigger, 3–19 to 3–24
P
PAL, PAL-M, 6–4, 6–6, 6–11
pan the waveform, 2–3, 4–18, 4–28
parameters
for trigger operator, 3–19 to 3–24
parameters for interface, 2–34
part numbers
cable, 1–5 to 1–9
grabbers, 1–5 to 1–9
ground lead, 1–5 to 1–9
parts
for test connectors, 7–9 to 7–10
removing and ordering, 8–2
parts list for oscilloscopes, 8–14
passive probe impedance, 4–39 to 4–42
Pattern, 3–17
pattern trigger, 3–17
adding edge qualifier, 3–17
and edge trigger combined, 3–22
applications of, 3–13
entered, 3–13
qualifying with edge, 3–13
patterns
defining for trigger, 3–21
entered, 3–19
exited, 3–19
satisfying trigger qualifier, 3–19
triggering on sequence of, 3–23
Peak Det softkey, 5–11
peak detect
display mode, 2–13, 5–11
peak detect mode, 2–13
peak detection, 4–11
peak-to-peak voltage, 5–33
performance characteristics, 9–2
acquisition system, 9–6
horizontal system, 9–5
input channels, 9–3
power requirements, 9–9
setup functions, 9–9
trigger system, 9–7
Performance Test Record
verify voltage readings, 7–12
period measurements, 5–28 to 5–29
phase measurement, 5–14 to 5–16
pivoting handle, 1–9
pixel memory, 4–43
poor uses
for edge trigger, 3–12
for pattern trigger, 3–13
Position knob, 2–26
position of time reference
in acquisition memory, 4–22 to 4–28
positioning channels, 2–26
pouch, 1–7
power requirements
performance characteristics, 9–9
power supply
of circuit under test, 1–11 to 1–12
removing, 8–8
to adjust, 7–30 to 7–32
voltage measurements, 7–31
power switch shaft
removing, 8–8
predefine test configurations, 4–44
predefined labels, 4–54 to 4–57
preset configuration, 4–48
Previous Menu softkey, 5–29
print
cancel or stop, 2–34
message, 10–6
waveform display, 2–34
probe
attach every third ground, 4–42
circuit models, 4–40
grounding, 4–40
grounding concepts, 4–39 to 4–42
high-frequency circuit, 4–40
inductance, 4–41
loading concepts, 4–39 to 4–42
low-frequency circuit, 4–39 to 4–42
Index
Index-5