Keithley 6514, Instruction Manual

Page: 329 / 334

Index
Numerics
20µA-20mA range accuracy 18-12
200M
Ω
-200G
Ω
range accuracy 18-17
20pA-2µA range accuracy 18-13
2k Ω -20M Ω range accuracy 18-15
2V analog output 11-7
A
Aborting calibration 19-5
Address commands F-9
Addressed multiline commands F-9
Amps calibration 19-10
Amps measurement accuracy 18-12
Amps measurement considerations 4-9
Amps measurement procedure 4-2
Amps Measurements 4-1
Analog outputs 11-7
Application 3-14, 5-7
Applications 4-13
Auto discharge 5-2
Automatic calculations 19-6
Autozero 2-2
B
Basic connections to DUT 2-6
Binning 10-4
Buffer 8-1
Buffer operations 8-2
Buffer statistics 8-3
Bus commands F-7
Bus description F-3
Bus lines F-5
Bus management lines F-5
C
Cable insulation resistance 4-14
Cable leakage resistance 3-9
Calibration 19-1
Calibration commands H-4
Calibration considerations 19-3
Calibration cycle 19-3
Calibration errors 19-5
Calibration menu 19-5
Calibration Options H-1
Calibration procedure 19-7
Calibrator voltage calculations 18-7
Capacitance measurements 5-7
Capacitor dielectric absorption 3-14
Capacitor leakage current 4-14
Changing function and range E-2
Changing the calibration code 19-18
Charge calculations 18-7
Clearing registers and queues 13-4
Command F-10
Command codes F-10
Common Commands 14-1, F-10
Component handler interface 10-6
Component handler types 10-7
Condition registers 13-15
Connection fundamentals 2-3
Contact information 1-2
Controlling the Model 6514 via the RS-232
COM2 port E-7
Coulombs calibration 19-14
Coulombs measurement accuracy 18-18
Coulombs measurement considerations 5-6
Coulombs measurement procedure 5-3
Coulombs Measurements 5-1
Current and charge calculations 19-6
Current calculations 18-7
D
Damping 4-4
Data lines F-5
Data transfer connections H-2
DDC Emulation Commands D-1
DDC language D-2
Default settings 1-12
Digital 6-9
Digital filter 6-9
Digital I/O port 11-2
Digital I/O, Analog Outputs, and External
Feedback 11-1
Digital output clear pattern 10-8
Digits 6-4
Diode leakage current 4-13
DISP test 20-4
Display 1-12
DISPlay subsystem 16-2
DISPlay, FORMat, and SYSTem 16-1
Displaying calibration dates 19-19
Displaying the calibration count 19-20
E
Electrochemical effects C-4
Electromagnetic Interference (EMI) C-5
Electrometer input circuitry 11-11
Electrostatic interference C-4