![background image](http://html2.mh-extra.com/html/keithley/6514/6514_instruction-manual_4064199136.webp)
Limit Tests
10-5
Figure 10-5 shows the basic limit testing flowchart expanded to include binning. Notice that
there are five possible output patterns (one pass pattern and four fail patterns), but only one will
be sent to the component handler for each DUT that is tested.
Pass
?
Start
Measure
DUT
Yes
Limit 1
Test
No
Display
“L1”
Limit 1
Test
Pass
?
Display
“L2”
Display “OK” and
Output Pass Pattern
Yes
No
End
Which
Limit
Failed
?
Output Fail
Pattern
HI Limit
Failure
Output Fail
Pattern
LO Limit
Failure
Which
Limit
Failed
?
Output Fail
Pattern
HI Limit
Failure
Output Fail
Pattern
LO Limit
Failure
Test
Another
DUT
?
No
Yes
Figure 10-5
Operation model
for limit testing
with binning
Summary of Contents for 6514
Page 203: ...14 CommonCommands...
Page 207: ...15 SCPISignalOriented MeasurementCommands...
Page 235: ...18 PerformanceVerification...
Page 254: ...19 Calibration...
Page 274: ...20 RoutineMaintenance...
Page 278: ...A Specifications...
Page 282: ...B StatusandErrorMessages...
Page 288: ...C GeneralMeasurement Considerations...
Page 294: ...D DDCEmulationCommands...
Page 299: ...E ExamplePrograms...
Page 306: ...F IEEE 488BusOverview...
Page 320: ...G IEEE 488andSCPI ConformanceInformation...
Page 324: ...H CalibrationOptions...