
TEST FEATURES
15-11
15
If TMS is high on the rising edge of TCK, the controller enters the Exit1-DR. If TMS is low on the
rising edge of TCK, the controller enters the Shift-DR state.
15.3.5.5
Shift-DR State
In this controller state, the test data register, which is connected between TDI and TDO as a result
of the current instruction, shifts data one bit position nearer to its serial output on each rising edge
of TCK. Test data registers that the current instruction selects but does not place in the serial path,
retain their previous value during this state.
The instruction does not change while the TAP controller is in this state.
If TMS is high on the rising edge of TCK, the controller enters the Exit1-DR state. If TMS is low
on the rising edge of TCK, the controller remains in the Shift-DR state.
15.3.5.6
Exit1-DR State
This is a temporary controller state. When the TAP controller is in the Exit1-DR state and TMS is
held high on the rising edge of TCK, the controller enters the Update-DR state, which terminates
the scanning process. If TMS is held low on the rising edge of TCK, the controller enters the
Pause-DR state.
The instruction does not change while the TAP controller is in this state. All test data registers
selected by the current instruction retain their previous value during this state.
15.3.5.7
Pause-DR State
The Pause-DR state allows the test controller to temporarily halt the shifting of data through the
test data register in the serial path between TDI and TDO. The test data register selected by the
current instruction retains its previous value during this state. The instruction does not change in
this state.
The controller remains in this state as long as TMS is low. When TMS goes high on the rising edge
of TCK, the controller moves to the Exit2-DR state.
15.3.5.8
Exit2-DR State
This is a temporary state. If TMS is held high on the rising edge of TCK, the controller enters the
Update-DR state, which terminates the scanning process. If TMS is held low on the rising edge of
TCK, the controller enters the Shift-DR state.
The instruction does not change while the TAP controller is in this state. All test data registers
selected by the current instruction retain their previous value during this state.
Summary of Contents for i960 Jx
Page 1: ...Release Date December 1997 Order Number 272483 002 i960 Jx Microprocessor Developer s Manual ...
Page 24: ......
Page 25: ...1 INTRODUCTION ...
Page 26: ......
Page 35: ...2 DATA TYPES AND MEMORY ADDRESSING MODES ...
Page 36: ......
Page 46: ......
Page 47: ...3 PROGRAMMING ENVIRONMENT ...
Page 48: ......
Page 73: ...4 CACHE AND ON CHIP DATA RAM ...
Page 74: ......
Page 85: ...5 INSTRUCTION SET OVERVIEW ...
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Page 111: ...6 INSTRUCTION SET REFERENCE ...
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Page 233: ...7 PROCEDURE CALLS ...
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Page 256: ......
Page 257: ...8 FAULTS ...
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Page 291: ...9 TRACING AND DEBUGGING ...
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Page 309: ...10 TIMERS ...
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Page 325: ...11 INTERRUPTS ...
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Page 369: ...12 INITIALIZATION AND SYSTEM REQUIREMENTS ...
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Page 413: ...13 MEMORY CONFIGURATION ...
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Page 429: ...14 EXTERNAL BUS ...
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Page 468: ......
Page 469: ...15 TEST FEATURES ...
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Page 493: ...A CONSIDERATIONS FOR WRITING PORTABLE CODE ...
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Page 503: ...B OPCODES AND EXECUTION TIMES ...
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Page 515: ...C MACHINE LEVEL INSTRUCTION FORMATS ...
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Page 523: ...D REGISTER AND DATA STRUCTURES ...
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Page 551: ...GLOSSARY ...
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Page 561: ...INDEX ...
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