
TEST FEATURES
15-7
15
15.3.2.3
RUNBIST Register
The RUNBIST register is a one-bit register that contains the result of the execution of the
runbist
instruction execution. The
runbist
instruction runs the built-in self-test (BIST) program resident
inside the processor. After the built-in self-test completes, the processor must be recycled through
the reset state to begin normal operation. See
section 12.2.2, “Self Test Function (STEST, FAIL)”
(pg. 12-6)
for details of the Built-In-Self-Test algorithm.
15.3.2.4
Boundary-Scan Register
The Boundary-Scan register is a required set of serial-shiftable register cells, configured in
master/slave stages and connected between each of the i960 Jx processor’s pins and on-chip
system logic. Pins NOT in the Boundary-Scan chain are power, ground and JTAG pins.
The Boundary-Scan register cells are dedicated logic and do not have any system function. Data
may be loaded into the Boundary-Scan register master-cells from the device input pins and output
pin-drivers in parallel by the mandatory
sample
/
preload
and
extest
instructions. Parallel loading
takes place on the rising edge of TCK in the Capture_DR state.
Data may be scanned into the Boundary-Scan register serially via the TDI serial-input pin, clocked
by the rising edge of TCK in the Shift_DR state. When the required data has been loaded into the
master-cell stages, it is driven into the system logic at input pins or onto the output pins on the
falling edge of TCK in the Update_DR state. Data may also be shifted out of the Boundary-Scan
register by means of the TDO serial-output pin at the falling edge of TCK.
Summary of Contents for i960 Jx
Page 1: ...Release Date December 1997 Order Number 272483 002 i960 Jx Microprocessor Developer s Manual ...
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Page 25: ...1 INTRODUCTION ...
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Page 35: ...2 DATA TYPES AND MEMORY ADDRESSING MODES ...
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Page 47: ...3 PROGRAMMING ENVIRONMENT ...
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Page 73: ...4 CACHE AND ON CHIP DATA RAM ...
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Page 85: ...5 INSTRUCTION SET OVERVIEW ...
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Page 111: ...6 INSTRUCTION SET REFERENCE ...
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Page 233: ...7 PROCEDURE CALLS ...
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Page 257: ...8 FAULTS ...
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Page 291: ...9 TRACING AND DEBUGGING ...
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Page 309: ...10 TIMERS ...
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Page 325: ...11 INTERRUPTS ...
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Page 369: ...12 INITIALIZATION AND SYSTEM REQUIREMENTS ...
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Page 413: ...13 MEMORY CONFIGURATION ...
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Page 429: ...14 EXTERNAL BUS ...
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Page 469: ...15 TEST FEATURES ...
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Page 493: ...A CONSIDERATIONS FOR WRITING PORTABLE CODE ...
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Page 503: ...B OPCODES AND EXECUTION TIMES ...
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Page 515: ...C MACHINE LEVEL INSTRUCTION FORMATS ...
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Page 523: ...D REGISTER AND DATA STRUCTURES ...
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Page 551: ...GLOSSARY ...
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Page 561: ...INDEX ...
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