Veeco Dimension 3100, Руководство пользователя

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Electric Techniques
Electric Force Microscopy
276 Dimension 3100 Manual Rev. D
Figure 16.2b Diagram of Extender Electronics Module for EFM
In many cases, you must apply a voltage to the tip or sample to achieve a high-quality image.
Various methods for applying voltages to the tip and sample are included in the sections that follow.
Samples with permanent electric fields may not require voltage application.
16.2.2 Electric Force Microscopy Preparation
This section explains how to apply a voltage to the tip or sample to generate electric fields. If the
sample has a permanent electric field which does not require the external application of voltage, the
steps below are not required and you can proceed to
Section 16.2.3 .
Setting Jumper Configurations
To apply voltage to the tip or sample, you may need to make minor changes to the jumpers on the
microscope’s backplane and the toggle switches on the Extender Electronics Module (if equipped).
Original jumper configurations and jumper changes are dependent on the microscope and the
desired measurements. The section
Jumper Configurations Without Extender Electronics:
Section provides jumper configuration instructions for basic microscope models operating with
and without the Extender Electronics Module.
The backplane board used with Dimension Series SPMs is shown below in Figure 16.2c . There is a
header supplied with jumpers at the center of the board. For non-EFM applications and Surface
Potential operation, leave or return jumpers to their original positions.
RMS
Phase Detector
Servo Controller
High Resolution
Oscillator
Oscillator Signal
Frequency Signal
Tapping
Piezo
Sample
Photodiode Signal
Phase Signal
Signals to
NanoScope
Cantilever Deflection Signal
Frequency
Control lines
Laser
Photodetector
Conditioning
Detector
Amplitude Signal
Reference
Signal
Beam
(feedback loop
adjusts oscillation
frequency until
phase lag is zero)
Extender Electronics Module