R&S AFQ100A
AFQ Commands - Signal Generation
1401.3084.32 6.8
E-3
[SOURce:]TSIGnal:CLOCk
1 kHz... 300 MHz
The command enters the sample clock frequency for generating either a sine, rectangular or a
table sine test signal.
1 kHz ... 300 MHz
The sample clock rate must not exceed the maximum ARB clock rate of 300 MHz. Sample clock
rates between 300 MHz and 600 MHz are not available and set to maximum ARB clock rate of
300 MHz.
Example:
SOUR:TSIG:CLOC 300e6
'sets sample clock frequency to 300 MHz.
*RST value
Resolution
Options
SCPI
1 MHz
Device-specific
[SOURce:]TSIGnal:PATTern:CREate
The command generates a waveform which is output directly.
This command triggers an event and therefore has no *RST value and no query form.
Example:
PATT:TSIN:CRE
'a signal is generated and output directly.
*RST value
Resolution
Options
SCPI
-
Device-specific
[SOURce:]TSIGnal:PATTern:CREate:NAMed
<waveform filename>
The command generates a sine test signal and stores the file on the local hard disk (HD).
The
Create Test Signal
window opens automatically and the signal can be stored as a waveform
file.
This command triggers an event and therefore has no *RST value and no query form.
Example:
TSIG:PATT:CRE:NAM "D:\temp\test.wv"
'writes the generated waveform file to 'test.wv' on the HD.
*RST value
Resolution
Options
SCPI
-
Device-specific
[SOURce:]TSIGnal:PATTern:I
0 ... 65535
Enters the pattern number of the I component.
Example:
TSIG:TSIN:PATT:I 5
'sets the test pattern for the I component to 5.
*RST value
Resolution
Options
SCPI
0
Device-specific
