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2400 Series SourceMeter
®
User’s Manual
Limit Testing
12-7
Immediate binning — Use immediate binning when you want to stop all testing after the
first failure occurs. Any pending tests will be cancelled, and the DUT will be placed in the
bin assigned to that test failure. If no failures occur, all enabled tests will be performed,
and the DUT will be placed in the assigned pass bin. This process is demonstrated in
Fig-
ure 12-3
.
Figure 12-3
Immediate binning
Using a sweep with immediate binning lets you test different devices at different source
levels. For example, assume a 3-point linear sweep at 1V, 2V, and 3V step levels. The first
DUT is tested at 1V, the second DUT is tested at 2V, and the third DUT is tested at 3V. In
this example, testing will stop when the first failure occurs.
End binning — End binning allows a sweep to finish before performing the binning oper-
ation. In the event of a failure, the first test failure determines the bin assignment. (See
Figure 12-4
.)
Using a sweep with end binning lets you test a device at different source levels. For exam-
ple, assume a 3-point list sweep at 1.1V, 2.2V, and 3.3V source levels. Limit testing will be
performed at each source level. After the completion of the three test cycles, the DUT is
placed in the appropriate bin.
Adding a scanner to the system lets you test each element of a multi-element device (i.e.,
resistor network). For example, the previous 3-point list sweep can be used to test a 3-
element resistor network. The first test cycle (using the 1.1V source level) tests the first
element of the network. The second test cycle (2.2V) tests the second element of the net-
work, and last test cycle (3.3V) tests the third element. After the three test cycles are fin-
ished, the resistor network is placed in the appropriate bin.
Figure 12-4
End binning
Test1
Test2
Test3
Pass
Fail
Pass
Digital I/O
Pass/Fail
Notification
Test1
(Pass)
Test2
(Fail)
Test3
(Pass)
Fail
Digital I/O
Notification
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Содержание SourceMeter 2400
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