
I
Automating Measurements
Configuring Your Test System
HP VEE
Microsoft@
C and C++
HP VEE is a powerful application which lets you graphically create programs
to control your instrument. VEE automatically handles the programming
details so you can focus on higher level tasks. It also contains statistical
functions which you can use to monitor your production process.
VEE runs on PCs and HP-UX and Sun Workstations.
VEE is used in conjunction with a VEE instrument driver. The VEE
instrument driver presents the user with a picture of the instrument’s front
panel on the computer display. Using the mouse, the user clicks on the front
panel keys to control the instrument, similar to
keystroke recording.
For information on VEE including literature and preview disks, please call the
HP Test and Measurement Call Center at
extension 9141.
Outside the U.S., contact your nearest HP Sales or Service office. Refer to
Chapter 10 for a table of sales and service offices.
has been a popular programming language, since it runs on PCs.
It does not offer a rich keyword set as does HP BASIC, and is not optimized
for instrument control. lb control the analyzer via HP-IB, an
card and
driver library must be installed. The driver library will provide subroutines
such as IOOUTPUT and IOENTER which let you control your analyzer.
If you are using C or C + + , you will need to link in a driver library to use
your HP-IB card. HP offers a library called Standard Instrument Control
Library (SICL). SICL is available for PCs running Microsoft Windows and
using HP’s HP-IB card. SICL is also available on HP series 700 UNIX
workstations.
For LAN communication with your analyzer, C or C+ + are often used.
Multi-threaded programs can be created to allow easy and precise control of
many analyzers operating asynchronously. This approach maximizes speed
and throughput.
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Содержание 8712C
Страница 1: ...I I User s Guide HP 8712C and HP 8714C RF Network Analyzers I ...
Страница 17: ...I 1 Installing the Analyzer ...
Страница 35: ...I 2 Getting Started ...
Страница 54: ...I 3 Making Measurements ...
Страница 81: ......
Страница 119: ...4 Using Instrument Functions ...
Страница 182: ...Using Instrument Functions Customizing the Display Figure 4 24 Expanded Display 4 64 ...
Страница 223: ...5 Optimizing Measurements ...
Страница 244: ...6 Calibrating for Increased Measurement Accuracy ...
Страница 280: ...7 Automating Measurements ...
Страница 298: ......
Страница 362: ...8 Front Rear Panel ...
Страница 373: ......
Страница 381: ......
Страница 386: ... 9 w I Suftkey Reference ...
Страница 477: ...I 10 Specifications and Characteristics ...
Страница 501: ...11 Safety and Regulatory Information ...
Страница 508: ...I 12 preset State and Memory Allocation ...
Страница 527: ...Index ...
Страница 559: ...Y X 9 91 YYW m m IiH rn 9 91 Z zeroing detectors 6 15 Index 33 ...