Loop Mux Registers Reference
225
SNIU028A – February 2016 – Revised April 2016
Copyright © 2016, Texas Instruments Incorporated
Loop Mux
5.14.29 Loop Mux Test Register (LOOPMUXTEST) (Test Use Only)
Address 00020074
Figure 5-30. Loop Mux Test Register (LOOPMUXTEST) (Test Use Only)
18
17
16
15
10
BIST_COMP
BIST_EN
EADC_TRIM
_TEST_EN
EADC_REF_TRIM
R-0
R/W-0
R/W-0
R/W-000000
9
8
7
2
1
0
EADC_REF
_RESET
EADC_REF
_EN
GAIN_TRIM
AFE_GAIN
R/W-1
R/W-0
R/W-0000 00
R/W-11
LEGEND: R/W = Read/Write; R = Read only; -
n
= value after reset
Table 5-30. Loop Mux Test Register (LOOPMUXTEST) (Test Use Only) Register Field Descriptions
Bit
Field
Type
Reset
Description
18
BIST_COMP
R
0
High-Speed Loop BIST Complete Status
0 = High-Speed Loop BIST not complete
1 = High-Speed Loop BIST completed
17
BIST_EN
R/W
0
High-Speed Loop BIST Enable
0 = High-Speed Loop BIST disabled (Default)
1 = High-Speed Loop BIST enabled
16
EADC_TRIM
_TEST_EN
R/W
0
EADC Trim Test Mode Enable
0 = EADC Trim Test Mode disabled (Default)
1 = EADC Trim Test Mode enabled, bits 15:0 provided to all 3 Analog Front End
modules
15-10
EADC_REF_TRIM
R/W
000000
EADC Reference Trim Value. Bits will be programmed during test and should not be
overwritten by firmware.
9
EADC_REF
_RESET
R/W
1
EADC Reference Reset
0 = Reference not in reset
1 = Resets Reference (Default)
8
EADC_REF_EN
R/W
0
EADC Reference Enable
0 = Disables EADC Reference (Default)
1 = Enables EADC Reference
7-2
GAIN_TRIM
R/W
0000 00
Sets trim for EADC Gain.
1-0
AFE_GAIN
R/W
11
AFE Front End Gain Setting
0 = 1x Gain, 8mV/LSB
1 = 2x Gain, 4mV/LSB
2 = 4x Gain, 2mV/LSB
3 = 8x Gain, 1mV/LSB (Default)