R&S AFQ100A
AFQ Commands - Signal Generation
1401.3084.32 6.13
E-3
[SOURce:]TSIGnal:SINE:CREate:NAMed
<waveform filename>
The command generates a signal and stores the file on the local hard disk (HD).
The
Create Test Signal
window opens automatically and the signal can be stored as a waveform
file.
This command triggers an event and therefore has no *RST value and no query form.
Example:
TSIG:SINE:CRE:NAM "D:\temp\test.wv"
'writes the generated waveform file to 'test.wv' on the HD.
*RST value
Resolution
Options
SCPI
-
Device-specific
[SOURce:]TSIGnal:SINE:FREQuency?
The command queries the resulting frequency of the test signal.
The command is a query command and therefore has no *RST value.
Example:
TSIG:SINE:FREQ?
'queries the resulting frequency of the test signal.
Response:
"80000"
'the frequency amounts 80000 kHz.
*RST value
Resolution
Options
SCPI
-
Device-specific
[SOURce:]TSIGnal:SINE:PHASe
-180 ... 180 degree
The command sets the phase offset of the sinewave signal on the Q channel relative to the
sinewave signal on the I channel.
Example:
TSIG:SINE:PHAS 45
'sets the phase offset of the Q channel to 45 degree.
*RST value
Resolution
Options
SCPI
-90
Device-specific
[SOURce:]TSIGnal:SINE:SAMPles
4 ... 1000 samples
The command sets the number of sample values required from the sine wave per period.
The resulting clock rate must not exceed the maximum ARB clock rate of 300 MHz.
The number of sample values is automatically restricted by reference to the set frequency.
Example:
TSIG:SINE:SAMP 500
'sets the number of samples to 500 for a period.
*RST value
Resolution
Options
SCPI
100
Device-specific