NEC Express 5800, User Manual

Page: 648 / 719

Operation and Maintenance
648
Details of System Diagnostics
Test Items
Test item Test name Test target device
Memory test Memory access test Memory
Cache test CPU cache CPU test
Floating point arithmetic
test CPU
DVD test Random read test Internal DVD drive
MT test Read test External storage
HDD test Random read test Internal HDD, external storage
Ether test Internal loopback test Onboard LAN, extended LAN
Note
■ Note on disk array
For disk array device, it is controlled as the test target device per each logical device.
System diagnostics sets the upper limit of the test target devices up to one logical disk per
one port of the card
More than one logical disk per one port are not displayed on the test menu.
■ Note on tape library
For tape library, it is controlled as the test target device in each LUN.
System diagnostics sets the upper limit of the test target LUN up to 16 per one tape library.
More than 16 LUNs are not displayed on the test menu.
Before the test for assembled type MT device is executed, move the media from the
magazine to the drive since it is not allowed moving the drive from the magazine.
■ Note on executing LAN card loopback tests of multiple ports simultaneously with the system
diagnostics
When LAN card loopback tests are executed simultaneously for multiple ports, the count
may not proceed from
“1” and the test result may become “fail.” This is most likely caused
by a special test mode setting of packet loopback inside of the card, which is not used on OS
operation.
When the round does not proceed from
“1” and the test result is “fail,” end the test
temporarily and execute the test again. The card is judged as failure only when “fail”
occurred again on the same port.