Tabor Electronics 5251, Руководство пользователя

Страница: 234 / 298

TE5251
User Manual
5-12
Table Chapter 5-13, Sinewave Flatness, DAC Output Test
5251 Sine
Frequency Error Limits Oscilloscope Reading Pass Fail
1 MHz 6 Divisions Reference X X
10 MHz 6 ±0.2 Divisions
50 MHz 6 ±0.3 Divisions
100 MHz 6 ±0.5 Divisions
Sinewave Flatness,
DDS Output
Equipment: Oscilloscope
Preparation:
1. Configure the Oscilloscope follows:
Termination: 50
Ω
, 20 dB feedthrough attenuator at the
oscilloscope input
Setup:
As required for the test
2. Connect 5251 output to the oscilloscope input
3. Configure the 5251 as follows:
Waveform: Modulated
Modulation:
OFF
Amplitude: 5 V
Output: On
CW Frequency: Initially, 1 kHz then, as required by the test
Test Procedure:
1. Adjust the vertical controls of the Oscilloscope to get 6 division of
display
2. Perform Sine flatness, DDS waveforms tests using Table 14
Table Chapter 5-14, Sinewave Flatness Test, DDS Output
5251 Sine
Frequency Error Limits Oscilloscope Reading Pass Fail
1 MHz 6 Divisions Reference X X
10 MHz 6 ±0.2 Divisions
50 MHz 6 ±0.3 Divisions
100 MHz 6 ±0.5 Divisions
Trigger operation
Characteristics
This tests the operation of the trigger circuit. It includes tests for the
triggered, gated and counted bursts run modes. It also tests the
operation of the trigger advance options, the delayed trigger and re-
trigger functions, as well as the trigger input level and slope sensitivity.