e-STUDIO170F Troubleshooting
January 2005 © TOSHIBA TEC
11 - 2
11.1.1
AUTO TEST [MENU], [9], [1]
In AUTO TEST mode, the users follow the procedure to automatically perform a series of test items in
succession.
Note:
AUTO TEST cannot be performed if the data, such as received data, delayed transmission, or
polling data, is stored in the memory.
The test items to be performed in AUTO TEST mode are as follows:
• FLASH ROM TEST
Checks the firmware, function data, and language data stored in the Flash ROM.
• SRAM TEST
Performs a read/write test on the SRAM.
(For the contents of the test, refer to
P.11-17 "[ 3 ] SRAM TEST [MENU], [9], [4], [03]".)
• DRAM TEST
Performs a read/write test on the DRAM.
(For the contents of the test, refer to
P.11-18 "[ 4 ] DRAM TEST [MENU], [9], [4], [04]".)
• MODEM TEST (Quick test)
Performs a read/write test on the MODEM register and detects a line current.
• SCANNER TEST
Tests the image scanning operation of the CIS and performs a read/write test on the internal mem-
ory of the DSC.
(For the contents of the test, refer to
P.11-23 "[ 10 ] SCANNER TEST [MENU], [9], [4], [10]".)
• CODEC TEST
Tests the coding/decoding operation of the CODEC.
(For the contents of the test, refer to
P.11-23 "[ 11 ] CODEC TEST [MENU], [9], [4], [11]".)
• PRINTER TEST
Prints a test pattern sheet to check the operation of each section (HVPS, LSU, Fuser, and so on) of
the printer.
1) Use the [
Ç
] or [
È
] key to select “1. AUTO TEST”, and then press the [ENTER] key.
The auto test starts, and
appears on the screen indicating that the test is in execution.
Remark:
To suspend the auto test, press the [STOP] key.
2) When all the tests completed, the "OPERATION COMPLETED" message is displayed and the dis-
play returns to showing the standby mode screen.
Remark:
The result of the auto test can be checked with the self test report. For printing the self test
report, refer to
P.11-13 "11.1.3 TEST RESULT LIST [MENU], [9], [3]".
If the result of the auto test is judged to be NG, perform the relevant function test listed above to
solve the problem.
AUTO TEST
AUTO TEST
Summary of Contents for ESTUDIO170F
Page 2: ... 2005 TOSHIBA TEC CORPORATION All rights reserved ...
Page 192: ...e STUDIO170F Function Settings January 2005 TOSHIBA TEC 4 132 ...
Page 214: ...e STUDIO170F Mechanical Description January 2005 TOSHIBA TEC 5 22 ...
Page 308: ...e STUDIO170F Circuit Description January 2005 TOSHIBA TEC 7 78 ...
Page 372: ...e STUDIO170F Removal Replacement Adjustment January 2005 TOSHIBA TEC 8 64 ...
Page 490: ...e STUDIO170F Appendix January 2005 TOSHIBA TEC 12 8 ...
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