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4200-900-01 Rev. K / February 2017
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Model 4200-SCS User’s Manual
Section 3: Common Device Characterization Tests
described above, but adds support for an external Keithley switch matrix.
Example results for the Endurance tests are shown in
and
FlashEndurance-NAND tests
FlashEndurance-NAND tests consist of the following test:
• Program
• SetupDC-Program
• Vt-MaxGm-Program
• Erase
• SetupDC-Erase
• Vt-MaxGm-Erase
The project navigator for FlashEndurance-NAND is shown in
Stressing for the FlashEndurance-NAND tests are configured from the Subsite
Setup tab for the FlashEndurance subsite plan.
The default setup (shown in
and
) uses Segment ARB
®
waveforms to perform log stressing that ranges from 1 to 100,000 counts.
The Segment ARB waveform files (Flash-NAND-Vg-ksf and Flash-NAND-Vd-ksf)
used for stressing are loaded into the Device Stress Properties window shown in
. The stress properties window is opened by clicking the
Device
Stress Properties
. Example results for the Endurance
tests are shown in Subsite Graph tab (see
Figure 3-112
FlashEndurance-NAND project plan
Summary of Contents for 4200-SCS
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