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4200-900-01 Rev. K / February 2017
Section 3: Common Device Characterization Tests
Model 4200-SCS User’s Manual
1. Select
Enable Cycles
.
2. Select the
Segment Stress / Measure Mode
.
3. Select and configure
Stress / Measure Cycle Times:
If needed, specify a
Stress / Measure Delay
. This allows the device to settle after stressing
before performing the DC measurements.
4. Periodic testing is not available for the Segment Stress / Measure Mode.
5. Clicking the
Apply
button updates the settings in the Subsite Setup tab. The button will be
inactive if updating is not required.
6. Click
Device Stress Properties
to open the window to configure the Segment ARB
®
waveform, SMU bias levels and matrix connections (see
Device Stress Properties on page 3-89
to continue the configuration process.
Figure 3-70
Segment stress / measure mode: Log and list cycle counts
Linear cycle counts:
After setting the first and total stress counts, and the number of
stresses, the linear
Stress Counts
will be automatically
calculated and displayed when
Apply
is clicked (Step 5). The
Number of Stresses must be less than the Total Stress Count, or
an error will be displayed. Note that the Total Stress Count is
cumulative.
Log cycle counts:
After setting the first and total stress counts, and the number of
stresses per decade, the log
Stress Counts
is automatically
calculated and displayed when
Apply
is clicked (step 5) (see
). Note that the Total Stress Count is cumulative.
List cycle counts:
Cycle counts are added to the
Cycle Times
list by entering a
count value into the
Stress Counts
field and clicking
Add
. A
cycle count value can be removed by selecting it and clicking
Remove
(see
). Note that the Total Stress Count is
cumulative.
Log cycle
List cycle
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