Keithley 4200-SCS, User Manual

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3-68 Return to Section Topics 4200-900-01 Rev. K / February 2017
Section 3: Common Device Characterization Tests Model 4200-SCS User’s Manual
How to perform reliability (stress-measure) tests on my device
Connecting devices for stress / measure cycling
Devices that are stress / measure cycled in parallel are connected through a
switch matrix.
Figure 3-49 shows an example of such connections for an HCI
evaluation.
Figure 3-49
Stress / measure wiring example
4 2 1 0-
S M U
5
Ground
Unit
D urin g Characteri z ation o f E ach Transistor
V ds = S M U3
Vg s = S M U 1
V bb = S M U2
V ss = Ground Unit
D urin g Stress
S M U 1 = Common Gate
S M U2 = Common Substrate
S M U3 = All D rains at 3 . 5 V olts
S M U 4 = All D rains at 4. 0 V olts
S M U5 = All D rains at 4. 5 V olts
4200-SCS
S w itch M atrix
8 ´ 3 6 ( Three cards in
M ain f rame )
4 2 1 0-
S M U
4
4 2 1 0-
S M U
3
4 2 1 0-
S M U
2
4 2 1 0-
S M U
1
Pream p Pream p Pream p
GPIB
S
e
n
s
e
F
o
r
c
e
L
o
w
1 2 3 6
1 2 3 6
1 2 3 6
6 Cables
6 Cables
6 Cables
6 Cables