Keithley 4200-SCS, User Manual, Page: 234 / 335

3-128 Return to Section Topics 4200-900-01 Rev. K / February 2017
Section 3: Common Device Characterization Tests Model 4200-SCS User’s Manual
Erase test – This test uses the partially pre-defined waveform shown in Figure
3-102 to erase a flash memory device. Figure 3-105 shows the Definition tab.
Figure 3-105
Flash-NAND project – Erase definition tab
Fast-Program-Erase test – This test uses a partially pre-defined waveform, see
Figure 3-103 , to program and erase a flash memory device. Figure 3-105 shows
the Definition tab for this test is shown in Figure 3-106 .
Figure 3-106
Flash-NAND project – Fast-Program-Erase definition tab