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4200-900-01 Rev. K / February 2017
Section 3: Common Device Characterization Tests
Model 4200-SCS User’s Manual
Erase test
– This test uses the partially pre-defined waveform shown in
to erase a flash memory device.
Figure 3-105
Flash-NAND project – Erase definition tab
Fast-Program-Erase test
– This test uses a partially pre-defined waveform, see
, to program and erase a flash memory device.
shows
the Definition tab for this test is shown in
Figure 3-106
Flash-NAND project – Fast-Program-Erase definition tab
Summary of Contents for 4200-SCS
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