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Intel
®
413808 and 413812—Test Logic Unit and Testability
Intel
®
413808 and 413812 I/O Controllers in TPER Mode
Developer’s Manual
October 2007
782
Order Number: 317805-001US
18.0
Test Logic Unit and Testability
18.1
Overview
This chapter summarizes testability and configuration features incorporated in the
Intel
®
413808 and 413812 I/O Controllers in TPER Mode (4138xx).
The 4138xx test and control logic is based on the IEEE 1149.1-2001 Standard Test
Access Port and Boundary-Scan Architecture document (available from the IEEE). The
TAP controller supports on-chip test logic such as Built-In Self Test and boundary-scan.