
11.4.14
Phase preference logic PPLPHIZ
Prepare the IED for verification of settings outlined in Section
The Phase preference logic function PPLPHIZ is tested with a three-phase testing
equipment for distance protections. PPLPHIZ is tested in co-operation with the Distance
protection zone, quadrilateral characteristic function ZMQPDIS (21). The distance
protection and the phase preference logic shall be set to values according to the real set
values to be used. The test is made by means of injection of voltage and current where the
amplitude of both current and voltage and the phase angle between the voltage and current
can be controlled.
During the test the following binary signals (outputs) shall be monitored:
•
Trip signal from distance protection
•
Trip signal from phase preference logic
1. Connect the test set for injection of voltage and current.
2. Inject voltages and currents corresponding to a phase-to-phase to ground fault within
zone 1 of the distance protection function. In the test one of the current inputs (one of
the faulted phases) is disconnected. The remaining current is the fault current out on
the protected line. All combinations of two phase-to-ground faults with one phase
current are tested. The result shall be according to table
. It should be checked that
the fault will give phase-to-phase voltage, phase-to-ground voltage, zero-sequence
voltage and phase current so that the conditions set for the logic are fulfilled.
Table 32:
Operation at different combinations of faults and operation mode
OperMode
Fault type/Faulted phase current to the IED
A_BG/IA
A_BG/IB
B_CG/IB
B_CG/IC
C_CG/IA
C_AG/IC
No Filter
Trip
Trip
Trip
Trip
Trip
Trip
No Pref
Trip
Trip
Trip
Trip
Trip
Trip
1231c
Trip
No Trip
Trip
No Trip
No Trip
Trip
1321c
No Trip
Trip
No Trip
Trip
Trip
No Trip
123a
Trip
No Trip
Trip
No Trip
Trip
No Trip
132a
Trip
No Trip
No Trip
Trip
Trip
No Trip
213a
No Trip
Trip
Trip
No Trip
Trip
No Trip
231a
No Trip
Trip
Trip
No Trip
No Trip
Trip
312a
Trip
No Trip
No Trip
Trip
No Trip
Trip
321a
No Trip
Trip
No Trip
Trip
No Trip
Trip
Section 11
1MRK 504 165-UUS -
Testing functionality by secondary injection
172
Transformer protection RET670 2.2 ANSI
Commissioning manual
Summary of Contents for RELION RET670
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