Toshiba ESTUDIO170F, Руководство по обслуживанию

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January 2005 © TOSHIBA TEC e-STUDIO170F Troubleshooting
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11.1.2 INDIVIDUAL TEST [MENU], [9], [2]
In INDIVIDUAL TEST mode, the users follow the procedure to test this machine in interactive mode.
1) Use the [ Ç ] or [ È ] key to select “2. INDIVIDUAL TEST”, and then press the [ENTER] key.
2) Use the [ Ç ] or [ È ] keys to select the desired item, and then press the [ENTER] key.
There are the following individual tests. For details, refer to the description of each test item listed
below.
[ 1 ] ADF TEST [MENU], [9], [2], [01]
This test checks the operation of the ADF by transporting and unloading documents. You can check
that the ADF is normal if the number of documents loaded is consistent with the number of documents
transported and unloaded.
1) Use the [ Ç ] or [ È ] key to select “01. ADF TEST”, and then press the [ENTER] key.
Remark:
You can change the transport speed by pressing the [MODE] key.
STD:
Fast
FINE (Same when HALF TONE is set): Medium
S-FINE (Same when HALF TONE is set): Slow
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INDIVIDUAL TEST
01 . ADF TEST
02 . KEY TEST
03 . LED TEST
04 . LCD TEST
05 . SPEAKER TEST
06 . SENSOR TEST
07 . PRINT TEST
08 . TONER IC TEST
ADF TEST
Set the document
LOAD DOCUMENT
ADF TEST
PRESS [START]