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HDO9000 High Definition Oscilloscopes Operator's Manual
Pass/Fail Testing
Pass/Fail testing allows you to define a set of qualifying conditions that an acquisition may "pass" or
"fail" when tested against, then take actions depending on whether the result is a pass or a fail.
l
compares sampled values to a pre-defined area of the grid (the "mask") to see if
they fall within or without.
l
compares a measurement result to a pre-defined value (Param
compare) or to another measurement (Dual param compare).
You can preconfigure to eight qualifiers (Q
x
) using either method, which are then enabled by selecting
them on the Pass/Fail dialog and defining what combination of results constitutes a "Pass" on the
dialog.
Mask Test Qualifiers
Testing against a mask is particularly useful for comparing newly acquired signals to a previously
acquired "golden standard" waveform.
A mask defines an area of the grid against which a source Channel, Zoom, or Math trace is compared.
Test conditions are associated with the mask, defining how the waveform is to be compared to the
masked area (e.g., some/all values fall within, some/all values fall outside), and a Pass or Fail result
is returned indicating the condition was found to be true or false.
Mask testing can be done using a pre-defined mask or a mask created from a waveform with user-
defined vertical and horizontal tolerances. Some industry standard masks used for compliance
testing are included with the oscilloscope software. The mask test can be confined to just a portion
of the trace by the use of a measure gate.
Access Mask Test Dialogs
1. Choose
Analysis > Pass/Fail
to display the
Pass/Fail
dialog.
2. Touch the
Q
x
button
where you want to set up the qualifier.
3. Select
Mask test
.
The Q
x
dialog opens with the Mask test condition selected and the
Test
,
Load Mask
,
Make Mask
, and
Gate
subdialogs displayed. On these dialogs, you manage, make, and apply gates to your mask.
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Содержание HDO9000
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