PerkinElmer Lambda 650, Руководство по оборудованию

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Lambda 650/850/950 Hardware Guide . 29
Specification Lambda 950 Lambda 850 Lambda 650
Stray Light
At 200 nm (12 g/l KCl
USP/DAP method)
At 220 nm (10 g/l NaI
ASTM method)
At 340 nm (50 mg/l
NaNO
2
ASTM method)
At 370 nm (50 mg/l
NaNO
2
ASTM method)
At 1420 nm (H
2
0 1 cm
pathlength)
At 1690 nm (CHCl
3
4 cm
pathlength)
At 2365 nm (CHCl
3
1 cm
pathlength)
> 2 A
≤ 0.00007 %T
≤ 0.00007 %T
≤ 0.00007 %T
≤ 0.00040%T
≤ 0.0015 %T
≤ 0.0005 %T
> 2 A
≤ 0.00007 %T
≤ 0.00007 %T
≤ 0.00007 %T
N/A
N/A
N/A
> 2 A
≤ 0.0001 %T
≤ 0.0001 %T
≤ 0.0001 %T
N/A
N/A
N/A
Wavelength Accuracy +/- 0.08 nm UV/Vis
+/- 0.30 nm NIR +/- 0.08 nm +/- 0.15 nm
Wavelength
Reproducibility
UV/Vis (Deuterium Lamp
Lines)
NIR (Deuterium Lamp
Lines)
Standard deviation of 10
measurements UV/Vis
Standard deviation of 10
measurements NIR
≤ 0.020 nm
≤ 0.080 nm
≤ 0.005 nm
≤ 0.020 nm
≤ 0.020 nm
N/A
≤ 0.005 nm
N/A
≤ 0.06 nm
N/A
Photometric Accuracy
Double Aperture
Method 1 A
Double Aperture
Method 0.5 A
NIST 1930D Filters 2 A
NIST 930D Filters 1 A
NIST 930D Filters 0.5 A
K
2
Cr
2
O
7
Solution
USP/DAP method
+/- 0.0006 A
+/- 0.0003 A
+/- 0.003 A
+/- 0.003 A
+/- 0.002 A
+/- 0.010 A
+/- 0.0006 A
+/- 0.0003 A
+/- 0.003 A
+/- 0.003 A
+/- 0.002 A
+/- 0.010 A
+/- 0.0012 A
+/- 0.0006 A
+/- 0.003 A
+/- 0.003 A
+/- 0.002 A
+/- 0.010 A