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Command Reference
R&S
®
CMW-KN5xx
75
User Manual 1176.7690.02 ─ 05
Manual operation:
See
CONFigure:LTE:MEAS<i>:ENB:MEValuation:MODulation:PDSCh:RHOA
<rhoA>
Specifies the PDSCH ρ
A
value and thus the PDSCH power level. You can set this
parameter to OFF or to a dB value.
Parameters:
<rhoA>
Range:
-6 dB to 6 dB
*RST:
OFF
Default unit: dB
Value OFF: ρ
A
is determined by the "E-UTRA Test Model"
Example:
See
Specifying Additional Measurement-Specific Settings
Firmware/Software:
V3.2.71
Manual operation:
See
6.3.5 Spectrum Measurement Settings
The following commands specify settings for the spectrum measurements.
CONFigure:LTE:MEAS<i>:ENB:MEValuation:SCOunt:SPECtrum:ACLR
............................... 75
CONFigure:LTE:MEAS<i>:ENB:MEValuation:SCOunt:SPECtrum:SEMask
............................ 75
CONFigure:LTE:MEAS<i>:ENB:MEValuation:SPECtrum:SEMask:MFILter
............................ 76
CONFigure:LTE:MEAS<i>:ENB:MEValuation:SPECtrum:ACLR:ENABle
................................76
CONFigure:LTE:MEAS<i>:ENB:MEValuation:SCOunt:SPECtrum:ACLR
<StatisticCount>
CONFigure:LTE:MEAS<i>:ENB:MEValuation:SCOunt:SPECtrum:SEMask
<StatisticCount>
Specifies the statistic count of the measurement. The statistic count is equal to the
number of measurement intervals per single shot. Use
CONFigure:...:MEAS<i>:...:REPetition SINGleshot | CONTinuous
to
select either single-shot or continuous measurements.
See also: "Statistical Settings" in the R&S
CMW user manual, chapter "Remote Con-
trol"
Separate statistic counts for ACLR and spectrum emission mask measurements are
supported.
Parameters:
<StatisticCount>
Range:
1 subframe to 1000 subframes
*RST:
10 subframes
Example:
See
Specifying Additional Measurement-Specific Settings
Firmware/Software:
V3.0.20
Manual operation:
See
"Emission Mask / ACLR > Statistic Count"
Multi Evaluation Measurement Commands
深圳德标仪器