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General Description
R&S
®
CMW-KN5xx
32
User Manual 1176.7690.02 ─ 05
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TX Power: RMS averaged power over all samples in the subframe
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Peak Power: peak power of all samples in the subframe
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RSTX Power: average of all reference symbol powers in the subframe, called
RSTP in 3GPP TS 36.141, Annex F.3.3
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OFDM Symbol TX Power: power of the 4
th
OFDM symbol in the subframe, called
OSTP in 3GPP TS 36.141, Annex F.3.3
For additional information refer to
chapter 3.8.11, "Common View Elements"
3.8.9 Selecting and Modifying Views
Use the "Display" parameters to select the views and to change the appearance and
contents of the views. Depending on the selected view the following "Display" hotkeys
are available at the bottom of the GUI:
Hotkey
Description
"Select View ..."
Switch to a certain detailed view or overview.
Alternatively select a diagram in the overview and press ENTER or the
rotary knob.
"Select Trace ..."
Select the trace types to be displayed in the view.
"X Scale... / Y Scale..."
Modify the ranges of the X-axis and the Y-axis.
"Margin On | Off"
For the spectrum emission mask measurement: show or hide margin
results
3.8.10 Using Markers
Use the "Marker" parameters to activate markers and to modify their position. The fol-
lowing "Marker" hotkeys are available at the bottom of the GUI:
Hotkey
Description
"Ref. Marker ..."
Enable or disable the reference marker and select the marker position. If sev-
eral traces can be displayed, a trace can also be selected.
"Marker 1 /2 ..."
Enable or disable marker 1 or 2 and define the marker position (absolute or rel-
ative to the reference marker).
Depending on the trace mode, a trace can also be selected.
"Select Trace Mode"
Define whether marker 1 and 2 are set to the same trace as the reference
marker (collective) or to selectable individual traces.
See also: "Markers" in the R&S
CMW user manual, chapter "System Overview"
3.8.11 Common View Elements
This section describes elements that are displayed in most views.
Measurement Results
深圳德标仪器
135-1095-0799