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11. Test parameter
Full-electronic HV-Tester F1-1x Typs
On
- voltage ramp down active. The test voltage is reduced linearly
from the test voltage to the start voltage as per the ramp down speed
and then switched off.
Ramp down speed (V/s)
- the test voltage is reduced linearly by the value
given per time unit.
11.1.3 Test time
Continuous test „on/off
“ - switches between continuous test and testing
with test time. A I>Imax fault (flashover) will end the test.
off
- test time active. The test voltage is applied for the duration of the
test time.
on
- continuous test active. The test voltage is applied continuously.
The test must be interrupted manually using the red „Reset“ button
S2/H2. The continuous test can last max. 999.9 seconds.
Test time (s)
- the test time can be set from 000.1 to 999.9s. The test time
is irrelevant in the case of „Continuous test on“.
Death time „on/off
“ - defines a period before the actual measurement. The
HV is applied, however the overcurrent tripping (I > Imax) is deactivated
for the time entered. This feature is provided for test objects that drawn
high switch on currents, e.g. test objects with a high capacitive load.
off
- no delay. The I>Imax evaluation is active.
on
- delay active. The I>Imax evaluation is disabled.
Death time (s)
- the delay time can be set from 000.1 to 999.9s
Note:
Delay time (dead time) is not active, at devices with safety current
limitation.
Fig. 11.4: HV test parameters - Test time
