
HANDLER/SCAN INTERFACE
13/10/2016 Version No. 001
97
Grading of each DUT is essentially the same as the compare
function, the difference being the Scan function will compare up
to 100 DUTs sequentially, whereas the Compare function will
compare only one DUT at a time.
The scan function compares a measured value to a “Reference”
value that has an upper (HI) and lower (LO) limit. If the measured
value is within the upper and lower limit, then the measured value
is judged as IN.
There are two modes that can be used to make a judgment: ABS
and
△
% modes.
The ABS mode compares the measured value to the upper (HI)
and lower (LO) limits. The upper and lower limits are set as
absolute resistance values.
The
△
% compare function compares the deviation of the
measured value from the reference value as a percentage.
{ [(Measured Value-Reference)/Reference]%}.
A measured value that falls within the upper and lower limits is
considered IN (pass), a value that falls below the lower limits is
considered LO, and a value that falls over the upper limit is a HI.
Reference
value
Upper
limit
Lower
limit
IN
HI
LO
Содержание RM-804
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