2
Setting
Scenes
(Measurement
Flow)
44
Processing Item Selection Guidelines
FZ3 User's Manual
Detecting defects and foreign materials
Method, objective
References
Detecting defects, contaminations
and spots on plain measurement
objects
[Defect]
Effective for detection of contamination or spots on plain backgrounds.
Reference:
"Processing Item List Manual", "Defect" (p.208)
Scratches, burrs
[Defect]
Effective for exterior detection of scratches and burrs on parts.
Reference:
"Processing Item List Manual", "Defect" (p.208)
Inspection for minor scratches,
contamination and backgrounds
other than plain backgrounds
[Fine Matching]
Effective for detection of minor defects and contamination on labels, etc.
Reference:
"Processing Item List Manual", "Fine Matching" (p.224)
Count
Method, objective
References
Inspection for number of
pins
[Edge Pitch]
Effective when calculating the number of IC or connector pins.
Reference:
"Processing Item List Manual", "Edge Pitch" (p.124)
Acesst 1.0 6251194
Содержание FZ3 Series
Страница 10: ...1 Before Operation 8 Operation Flow FZ3 User s Manual Operation Flow Operation flow is explained here...
Страница 28: ...1 Before Operation 26 Saving Settings and Turning Power Off FZ3 User s Manual...
Страница 60: ...2 Setting Scenes Measurement Flow 58 Editing Scene Groups FZ3 User s Manual...
Страница 106: ...4 Saving Loading Data 104 Loading Settings Data to Controller FZ3 User s Manual...
Страница 122: ...5 Changing the System Environment 120 Setting the System Operation Environment FZ3 User s Manual...