191
F(L)CS Data Acquisition
has no effect on the detector; it modifies the color look-up table, which renders low-
intensity structures more visible. It may also be helpful to accumulate over several
images. The
Offset
setting on the control panel has no effect on the image.
Figure 168:
Acquiring the reference image using APDs, setting the X1 port
7. Optimize the image quality. The functions for this are the same as outside the wizard.
8. Acquire an image by clicking the
Capture
image acquisition button or acquire an xyz or
xzy stack by clicking the
Start
image acquisition button. The start and finish of the stack
are defined interactively, in the usual way. The stack image is automatically added to
your LAS AF experiment.
18.2.2
Selecting Laser Lines as an Excitation Source for the Image
Acquisition
All available lasers can be used for the image acquisition (
). You will find a
description of the mode of operation in
18.2.2.1
Using Continuous Wave Lasers
For capturing the emitted fluorescence, set the acousto-optical beam splitter to
fluorescence (
). Choose a suitable laser line and adjust the intensity to the desired
level using the AOTF slider. If the system has a multifunction port (
MFP
), it should be set to
Substrate
.
Dependency of the spectral detection range of the APDs
The spectral detection range of the APDs is determined by the SMD filter
cube used, not by the slider settings for the photomultipliers.
Содержание TCS SP8 SMD
Страница 1: ...10 Living up to Life User Manual Leica TCS SP8 SMD for FCS FLIM and FLCS ...
Страница 4: ...4 Copyright ...
Страница 14: ...14 Contents ...
Страница 18: ...18 Intended Use ...
Страница 20: ...20 Liability and Warranty ...
Страница 28: ...28 General Safety Notes ...
Страница 32: ...32 Additional Notes on Handling the System ...
Страница 44: ...44 System Overview and Properties ...
Страница 60: ...60 SMD Components Figure 31 DSN 102 Dual SPAD Power Supply ...
Страница 80: ...80 Safety Features ...
Страница 102: ...102 Switching On the System ...
Страница 116: ...116 LAS AF ...
Страница 214: ...214 Changing the Specimen ...
Страница 216: ...216 Changing the Objective ...
Страница 218: ...218 Piezo Focus on an Upright Microscope Figure 186 Piezo focus controller Figure 187 Spacer on objective ...
Страница 238: ...238 Switching Off the System ...
Страница 242: ...242 Repairs and Service Work ...
Страница 244: ...244 Maintenance ...
Страница 246: ...246 Disassembly and Transport ...
Страница 248: ...248 Disposal ...
Страница 254: ...254 Contact ...
Страница 256: ...256 Recommended Literature ...
Страница 266: ...266 Appendix Figure 225 Declaration of conformity ...
Страница 268: ...268 Appendix ...
Страница 269: ......