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136
FLIM Data Acquisition
acquisition is applied to the detectors. In other words, the gain cannot be changed as long
as
FLIM
is selected.
3. Select a suitable range for spectral detection by adjusting the spectral sliders of the SP
FLIM detectors accordingly (
Figure 120, item 2 and 3
).
At the same time, additional detectors can be activated and used for intensity image
acquisition. The data of these additional detectors is used for the intensity image
acquisition, but not for FLIM.
4. If you do not obtain an image, check that the X1 port is in the
Mirror
position.
5. Check to ensure that the fluorifier disc is in a suitable position that blocks excitation light
(see
).
16.2.1.2
FLIM Data Acquisition with External MPD APDs
Proceed as follows to prepare the TCS SP8 for collecting FLIM data using external APDs:
1. Switch the APDs on electrically.
2. Select a suitable spectral range for the detection by choosing the appropriate SMD filter
cube and mount it in the X1 port adapter (see
).
3. Open the
Setup
tab.
4. In the
FLIM detector
pull-down menu, select the
External
option (
). In
Beam Path Settings
, the APDs should be selected automatically (
).
Overload protection for internal SP FLIM detectors
If too much light strikes a FLIM detector, it is temporarily switched off to
prevent damage and automatically switched back on after a few
seconds. If the detector count rate is not reduced, the detectors will
continuously switch off and back on, resulting in horizontal streaks in the
image.
The overload protection of the internal FLIM detectors is active in FLIM
mode and image acquisition mode. To avoid streaking, reduce the
detector count rate. This can be done in a number of ways:
• Reduce the laser intensity
• Reduce the
Gain
(possible in image acquisition mode only)
• Reduce the
Pinhole
• Use specimens with less intensive fluorescent dye
Содержание TCS SP8 SMD
Страница 1: ...10 Living up to Life User Manual Leica TCS SP8 SMD for FCS FLIM and FLCS ...
Страница 4: ...4 Copyright ...
Страница 14: ...14 Contents ...
Страница 18: ...18 Intended Use ...
Страница 20: ...20 Liability and Warranty ...
Страница 28: ...28 General Safety Notes ...
Страница 32: ...32 Additional Notes on Handling the System ...
Страница 44: ...44 System Overview and Properties ...
Страница 60: ...60 SMD Components Figure 31 DSN 102 Dual SPAD Power Supply ...
Страница 80: ...80 Safety Features ...
Страница 102: ...102 Switching On the System ...
Страница 116: ...116 LAS AF ...
Страница 214: ...214 Changing the Specimen ...
Страница 216: ...216 Changing the Objective ...
Страница 218: ...218 Piezo Focus on an Upright Microscope Figure 186 Piezo focus controller Figure 187 Spacer on objective ...
Страница 238: ...238 Switching Off the System ...
Страница 242: ...242 Repairs and Service Work ...
Страница 244: ...244 Maintenance ...
Страница 246: ...246 Disassembly and Transport ...
Страница 248: ...248 Disposal ...
Страница 254: ...254 Contact ...
Страница 256: ...256 Recommended Literature ...
Страница 266: ...266 Appendix Figure 225 Declaration of conformity ...
Страница 268: ...268 Appendix ...
Страница 269: ......