162
FLIM Data Acquisition
10. Define the duration of the individual FLIM images as described in
. If all
images are to have a comparable brightness, use the
Acquire until max ___ photons/
pixel
option. It enables corrections of intensity changes which are caused by the
excitation spectrum and by bleaching artefacts. If intensity information is required, use
Duration of each image
or
Repetitions
.
11. Start the FLIM stack acquisition with the image acquisition button
Run FLIM
.
In LAS AF, you obtain a
Λ
stack of time-averaged images and, in SymPhoTime, a series of
FLIM images.
16.3.10
Control of FLIM Measurements
The measurement series is started by clicking on the
Start FLIM
image acquisition button. It
stops automatically after all measurements are taken. A user-defined stop is possible by
clicking the
Stop FLIM
image acquisition button.
In the count rate monitor (
), the current count rate (in cps - counts per second) is
displayed during the individual measurements. In the line
Max. counts per pixel
, the total
number of photons accumulated so far in the brightest pixel of the image is shown. This
gives an initial indication as to whether the photon statistics in the image are sufficient.
After start of the FLIM series, fast FLIM images are displayed in SymPhoTime online and
saved together with the raw data.
Both the count rate and fast FLIM images give a first impression about the quality of the
measurements.
Figure 147:
Count rate monitor in the Measurements step of the FLIM Wizard
Содержание TCS SP8 SMD
Страница 1: ...10 Living up to Life User Manual Leica TCS SP8 SMD for FCS FLIM and FLCS ...
Страница 4: ...4 Copyright ...
Страница 14: ...14 Contents ...
Страница 18: ...18 Intended Use ...
Страница 20: ...20 Liability and Warranty ...
Страница 28: ...28 General Safety Notes ...
Страница 32: ...32 Additional Notes on Handling the System ...
Страница 44: ...44 System Overview and Properties ...
Страница 60: ...60 SMD Components Figure 31 DSN 102 Dual SPAD Power Supply ...
Страница 80: ...80 Safety Features ...
Страница 102: ...102 Switching On the System ...
Страница 116: ...116 LAS AF ...
Страница 214: ...214 Changing the Specimen ...
Страница 216: ...216 Changing the Objective ...
Страница 218: ...218 Piezo Focus on an Upright Microscope Figure 186 Piezo focus controller Figure 187 Spacer on objective ...
Страница 238: ...238 Switching Off the System ...
Страница 242: ...242 Repairs and Service Work ...
Страница 244: ...244 Maintenance ...
Страница 246: ...246 Disassembly and Transport ...
Страница 248: ...248 Disposal ...
Страница 254: ...254 Contact ...
Страница 256: ...256 Recommended Literature ...
Страница 266: ...266 Appendix Figure 225 Declaration of conformity ...
Страница 268: ...268 Appendix ...
Страница 269: ......