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103
LAS AF
14
LAS AF
The LAS AF software is used to control all system functions and acts as the link to the
individual hardware components. Image acquisition, image analysis and image processing
are carried out using LAS AF.
Within the Leica LAS AF software, FCS and FLIM experiments are designed and executed
using special Wizards. After data acquisition, the SMD data analysis is carried out within
the SymPhoTime (SPT) software by PicoQuant.
14.1
Starting LAS AF
NOTICE
Damage is possible when contacting the specimen stage
When using an inverted microscope, the illuminator arm must be swung
back before the system start and LAS AF start because the stage can
damage the condenser, the objective or the specimen during
initialization.
1. Click the LAS AF symbol on the desktop to start the software.
2. Select whether the system is to be operated in resonant (
Resonant: On
) or conventional
mode (
Resonant: Off
).
Figure 82:
Selection of resonant or conventional mode
LAS AF saves the settings for
Configuration
,
Microscope
and
Resonant
as they were set the
last time the software was started.
3. Now start LAS AF by clicking the
OK
button.
NOTICE
Objective damage is possible when contacting the specimen stage
When using an upright microscope, the specimen stage must be moved
down before the system start and LAS AF start because it could come
into contact with the objective during initialization and damage the
objective.
Содержание TCS SP8 SMD
Страница 1: ...10 Living up to Life User Manual Leica TCS SP8 SMD for FCS FLIM and FLCS ...
Страница 4: ...4 Copyright ...
Страница 14: ...14 Contents ...
Страница 18: ...18 Intended Use ...
Страница 20: ...20 Liability and Warranty ...
Страница 28: ...28 General Safety Notes ...
Страница 32: ...32 Additional Notes on Handling the System ...
Страница 44: ...44 System Overview and Properties ...
Страница 60: ...60 SMD Components Figure 31 DSN 102 Dual SPAD Power Supply ...
Страница 80: ...80 Safety Features ...
Страница 102: ...102 Switching On the System ...
Страница 116: ...116 LAS AF ...
Страница 214: ...214 Changing the Specimen ...
Страница 216: ...216 Changing the Objective ...
Страница 218: ...218 Piezo Focus on an Upright Microscope Figure 186 Piezo focus controller Figure 187 Spacer on objective ...
Страница 238: ...238 Switching Off the System ...
Страница 242: ...242 Repairs and Service Work ...
Страница 244: ...244 Maintenance ...
Страница 246: ...246 Disassembly and Transport ...
Страница 248: ...248 Disposal ...
Страница 254: ...254 Contact ...
Страница 256: ...256 Recommended Literature ...
Страница 266: ...266 Appendix Figure 225 Declaration of conformity ...
Страница 268: ...268 Appendix ...
Страница 269: ......