WHAT S NEW
21
need to make any difficult calculations to determine what the setting should be.
·
Enhanced Milliohm offset -
The milliohm offset function has been added to each step
in the memory to allow for different lead lengths when using a scanner to perform
multiple ground bond tests.
·
Ramp-HI function -
This is another enhancement for DC hipot testing. During a DC
test once the DUT is charged the actual leakage current is very low. Unfortunately,
users have not been able to set the trip point this low because unless the ramp time
was very slow false failures would occur during the ramp cycle when the DUT draws
more current due to charging. The new Ramp-HI function allows the instrument to
provide the full 10 mA output during the charge cycle and then monitor a much lower
setting during the dwell cycle when the DUT is fully charged.
·
Programmable security password -
Users can now program their own numeric
password to lock the front panel and only allow authorized personnel to change test
parameters.
·
Lighter weight and reduced size -
Both instruments are now enclosed in a smaller
3U rack mount cabinet to minimize their rack space needs. The lowest weight 500VA
instruments in the industry.
·
High resolution current metering -
Resolution in AC hipot mode is now 1 microamp
and 0.1 microamp in DC hipot mode.
·
High resolution timers -
The ramp and dwell time resolution has been improved to
0.1 second increments.
·
Digitally adjustable arc detection -
The arc detection mode is now menu controlled
and can be adjusted over a range of 1 - 9 to allow it to be adjusted for the DUT. In
addition, the arc detection sensitivity can now be controlled through the remote
interface which makes all functions completely programmable.
·
HypotULTRA II Continuity mode -
A continuity test mode has been added to the
HypotULTRA II to comply with UL and other safety agency specifications that call
for a basic low current ground continuity test.
·
Fail Stop ON/OFF mode -
This new mode is particularly useful in scanner
applications. This allows either instrument to be setup to continue testing after
detecting a failure. A display of all final PASS/FAIL results on items tested is
provided at the conclusion of the test cycle.
Содержание HypotULTRA II 7500DT
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