Rev. B
MultiMode SPM Instruction Manual
175
Chapter 11 Force Imaging
Force plots are used to measure tip-sample interactions and determine optimal setpoints. More
recently, microscopists have begun to collect force measurements across entire surfaces to reveal
new information about the sample. This area of SPM promises to open new chapters in materials
science, biology and other investigative areas.
Speci
fi
cally, this chapter details the following topics:
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Force Calibration Control Panels and Menus:
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Main Controls (Ramp Controls):
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Main Controls Panel (Display):
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Scan Mode Panel (Advanced Mode Only):
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Force Calibration (Contact Mode AFM):
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