SPM Fundamentals for the MultiMode
Terms and Abbreviations
46
MultiMode SPM Instruction Manual
Rev. B
2.6
Terms and Abbreviations
This section contains a brief list of terms and abbreviations to assist the reader. Other terms and
abbreviations are referenced in the Index at the back of this manual.
AFM
—Atomic force microscopy; atomic force microscope.
aliasing
—Electronic image error due to differences in resolution between surface features and the
pixels used to represent them.
bias
—Electrical potential applied to a tip or sample which causes electron
fl
ow to ensue from one
to the other. (STM and EFM only.)
calibration
—Measurement of known features to ensure accuracy of SPM images.
cantilever
—Flexible portion of probe extending from the substrate and to which the tip is attached.
cantilever tune
—Process of
fi
nding a cantilever’s natural, resonant frequency by exciting the
cantilever through a range of frequencies until maximum amplitude is obtained. The frequency at
which maximum amplitude is obtained is the resonant frequency.
DSP
—Digital signal processor. Computer processor used to control SPM feedback loop.
drive amplitude
—Amplitude of the signal used to oscillate a tip in TappingMode.
drive frequency
—Frequency of the signal used to oscillate a tip in TappingMode.
ECAFM
—Electrochemical atomic force microscopy; electrochemical atomic force microscope.
EFM
—Electric force microscope; electric force microscopy. Method of SPM used to image
electric forces on samples.
engagement
—Process of bringing a probe tip and sample together in a controlled manner such that
useful information about the surface is obtained without damaging either the tip or the sample.
error
—Difference between actual tip-sample force measured at the detector and the setpoint force.
false engagement
—Condition due to surface effects or insuf
fi
cient setpoint (too low during contact
AFM; too high during TappingMode) in which the feedback controller attempts imaging a sample
that is not engaged with the tip.
feedback
—Process of self-correction between probe’s actual, real-time height-surface force and its
intended height-surface force based upon the probe’s signal.
fl
uid cell
—Accessory used for imaging materials in
fl
uid, consisting of a specialized tipholder and
O-ring.
force modulation
—SPM mode used to image visco-elastic properties of materials.
