Tabor Electronics 5251, User Manual

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TE5251
User Manual
1-8
Memory Segmentation There is no need to use the entire memory every time an arbitrary
waveform is generated. The waveform memory can be divided into
smaller segments and different waveforms can be loaded into
individual segment. The various segments may then be loaded into
a sequence table to generate long and complex waveforms. The
sequence table can link up to 10k segments, while each segment
can loop up to 1 M times.
Remote Control The instrument must be used in conjunction with a host computer.
All of its functions, modes and parameters are fully programmable
using SCPI commands and syntax. There are three ways to
program the Model 5251, the first being low-level programming of
each individual parameter, using SCPI commands. The second
alternative is to use ArbConnection for high-level programming.
ArbConnection is a software package supplied with the 5251 that
simulates a mechanical front panel. It has all the necessary push
buttons, displays and dials to operate the instrument as if you were
using it on the bench. The third alternative is using application
specific drivers, such IVI or LabVIEW drivers.
The 5251 must be programmed to generate waveforms. Therefore,
it is recommended that the user becomes familiar with its basic
features, functions and programming concepts as described in this
and subsequent chapters.
Frequency Agility
The instrument generates its sample clock from a DDS circuit
(direct digital synthesis). The DDS circuit enables frequency agility
through the complete frequency range of the 5251. Having such an
enormous range opens the door for a wide range of applications
such as wide band sweep, FSK, frequency hops and frequency
modulation. The 5251 can also generate AM, ASK, PSK and
wireless modulation signals.
Supplied
Accessories
The instrument is supplied with a CD that includes an Instruction
Manual, ArbConnection for Windows 2000/XP/NT and plug & play
drivers.
Specifications
Instrument specifications are listed in Appendix A. These
specifications are the performance standards or limits against
which the instrument is tested. Specifications apply under the
following conditions: output terminated into 50
Ω
after 30 minutes of
warm up time, and within a temperature range of 20
°
C to 30
°
C.
Specifications outside this range are degraded by 0.1 % per
°
C.