Omicron Lab CT Analyzer, User Manual

Page: 115 / 254

113
The CT Analyzer Test Cards
Test results displayed in the Excitation card for IEEE C57.13
Ktd
Theoretical transient dimensioning factor.
3
x x x
E-max Maximum e.m.f. voltage.
This parameter allows the determination of the
working point on the excitation curve that
would be reached with the entered settings.
x x
^
ε
Peak instantaneous error at voltage E
max
.
x x
1. If the CT Analyzer is not able to measure up to the actual value, the prefix ">" is displayed to
indicate that the measurement value is larger than the displayed value.
2. If parameter "Spec." is set to "by Duty" in the CT-Object card (see page 93), no calculation is
performed for this parameter if the user did not specify values for T
p
and t
al1
in the CT-Object
card prior to the test.
3. This parameter is only displayed if parameter "Spec." is set to "by Duty" in the CT-Object card
(see page 93). No calculation is performed for this parameter if the user did not specify values
for T
p
and t
al1
in the CT-Object card prior to the test.
Param. Description Results displayed for
IEEE C57.13
protection
CTs
metering
CTs
V-kn Knee point voltage according to standard. x x
I-kn Knee point current according to standard. x x
Ls Saturated inductance. x x
Lm Non-saturated inductance. x x
Ts Secondary time constant. x x
Kr Remanence factor. x x
Vb Rated secondary terminal voltage. x
FS Instrument security factor (direct measurement
method), calculated for nominal and operating
burden.
1
1. If the CT Analyzer is not able to measure up to the actual value, the prefix ">" is displayed to
indicate that the measurement value is larger than the displayed value.
x
FSi Instrument security factor (indirect measurement
method), calculated for nominal and operating
burden.
1
x
Param. Description Results displayed for
IEC 61869-2
protection CTs, class
me
terin
g
CTs x
P
x
PR
PX PX
R
TP
X
TP
Y
TP
Z