Associated Research OMNIA II 8204, Operation And Service Manual

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From the DC Withstand Parameter Setting screen the following parameters may be
controlled: Voltage, HI-Limit, LO-Limit, Ramp Up, Dwell Time, Ramp Down, Charge-
LO, Arc Sense, Offset, Ramp-HI (ON/OFF), Arc Detect (ON/OFF), Continuity (DC
continuity or OFF), Scanner Channel, Step Name and More. Pressing the More soft
key will display the additional parameter Defaults.
Charge
–LO
The Charge-LO function is used to check if the cables are connected properly at the
beginning of a test. A capacitive DUT will draw charging current on the DC Withstand
Voltage test when the Output is activated. If the charging current is lower than the
setting, the test cables may not be connected properly.
The instrument can set the Charge-LO parameter manually or automatically. To
manually set the Charge-LO current, use the up and down arrow keys or the ENTER
key and scroll the highlighted area to the Charge-LO current parameter. Enter the
new Charge-LO current via the alphanumeric keypad and then press the ENTER key
to accept the new parameter or press the EXIT key to escape from the edit.
To automatically set the Charge-LO current, use the up and down arrow keys or the
ENTER key and scroll the highlighted area to the Charge-LO current parameter. Set
the voltage and ramp times to the values that will be used on the DUT and connect
the test cables or test fixture between the instrument and DUT. Press the TEST
button.
Please be aware that the program will activate high voltage
on the output connector when the Test button is pressed.
The program will read the charging current of DUT and set the Charge-LO current at
approximately one half (1/2) of the reading. The highlighted parameter field will briefly