SERDES Register Map
470
SBAU337 – May 2020
Copyright © 2020, Texas Instruments Incorporated
Serial Interface Register Maps
2.6.9 Register 4008h (offset = 4008h) [reset = 0h]
Figure 2-723. Register 4008h
7
6
5
4
3
2
1
0
RX_SD_CROSSOVER_COUNT[7:0]
R/W-0h
LEGEND: R/W = Read/Write; W = Write only; -n = value after reset
Table 2-729. Register 4008 Field Descriptions
Bit
Field
Type
Reset
Description
7-0
RX_SD_CROSSO
VER_COUNT[7:0]
R/W
0h
The count of the number of times the incoming signal must
cross the signal detect threshold level within the signal
detection window.
2.6.10 Register 4009h (offset = 4009h) [reset = 7Ah]
Figure 2-724. Register 4009h
7
6
5
4
3
2
1
0
RX_SD_CLOCK_CYCLES
RX_SD_CROSSOVER_COUNT[11:8]
R/W-7h
R/W-Ah
LEGEND: R/W = Read/Write; W = Write only; -n = value after reset
Table 2-730. Register 4009 Field Descriptions
Bit
Field
Type
Reset
Description
7-4
RX_SD_CLOCK_C
YCLES
R/W
7h
Number of clock cycles that defines the signal detection
window. The period is defined as 2^(N+6) UI, where N is a 4-
bit value. Zero is not valid for N.
3-0
RX_SD_CROSSO
VER_COUNT[11:8]
R/W
Ah
The count of the number of times the incoming signal must
cross the signal detect threshold level within the signal
detection window.
2.6.11 Register 400Eh (offset = 400Eh) [reset = 12h]
Figure 2-725. Register 400Eh
7
6
5
4
3
2
1
0
EM_DEPTH
R/W-9h
LEGEND: R/W = Read/Write; W = Write only; -n = value after reset
Table 2-731. Register 400E Field Descriptions
Bit
Field
Type
Reset
Description
4-1
EM_DEPTH
R/W
9h
The timer for eye margin measurement. This decides the
window for eye measurement in 4^(m-1) machine cycles.
2.6.12 Register 4010h (offset = 4010h) [reset = 8h]
Figure 2-726. Register 4010h
7
6
5
4
3
2
1
0
DFE_INIT_2[0]
DFE_INIT_3
R/W-0h
R/W-8h
LEGEND: R/W = Read/Write; W = Write only; -n = value after reset