Scientific 5000 Series, Руководство пользователя

Страница: 32 / 360

1 - OVERVIEW
1-2
Version 1.23
MODEL 5000 SERIES MANUAL
Single test measured parameters are measured beginning on the range of the value
entered in the test program. If auto range (AR) is programmed, the system will
automatically range to obtain the best resolution. If auto range down only (AR/D) is
selected, auto range will be only in the down direction if necessary. If auto range (AR
or AR/D) is not programmed, the parameter will be measured on the range of the
value entered in the test program. For best resolution, when auto range is turned off,
entered limits should be as near the expected answer as possible, otherwise the
reported value may not appear to be repeatable (if at the low end of the range).
For example, when auto range is turned off, if an I
R
test is programmed for a
20
μAmaximum limit and the actual answer is much less than 10μA, the reported
answer could vary as much as 50
ηA to 100ηA. In this example, the limit of 20μA is
on the 100
μA range (100,000ηA) and 100ηA is 0.1% of the range, hence, variations
of this order can be expected.
1.1.2 5300HX Test System
The 5300HX test system includes some options not available on the Model 5000E.
See current price list for available options.
1.1.3 Math Expression
The PCW software provides the capability to perform mathematical manipulation of
test results. Using this feature parameter substitutions may be made such the test
entry is the result of some calculation including the result of a previous test, or a new
test step reporting the calculation of ratios, deltas, percentages, min-max limits etc. of
two or more previous tests (see Section 6.6.1.2)
1.1.4 Per Step Scan
The 5000 Series Tester allows the Model 6010 Scanner (see Section 10 or Appendix
Q) to be directed independently in the test program. This provides a means to test a
variety of devices with a single package (e.g.- hybrids). Scan 1, for example, could
be assigned to a group of transistor tests, Scan 2 to diode tests, and so on up to a
maximum 24 possible scans. The only limit is a maximum of 99 total tests.
1.1.5 Pin Programmable Scanner
The 5000 Series Tester allows the adaptors ADP401A-8 or 16 to be programmed.
Any drive / sense pair (A-A
S
, G-G
S
, K-K
S
) can be connected to any scanner output
pin (1-8 or 1-16). Personality modules are available for various packages.
1.1.6 Mux Capabilities
The Multiplex Option allows three or four stations to be connected to the 5000 Series
Tester. This can be configured as any combination of Manual Stations or
Handler/Probers. A High Current Deck, Low Current Deck, 6010 Scanner or any
special adaptor can be connected to any of the four stations. See Section 12 or
contact the factory for more information.
1.1.7 Applications
The 5000 Series Testers are automatic discrete semiconductor test systems intended
for incoming inspection and manufacturing of semiconductors (high speed full datalog
with the Model 5000E and 5300HX). The systems tests triacs, S
CR‟s, transistors,
MOSFET‟s, J-FET‟s, zener diodes, diodes, MOV‟s, and with optional adaptors and/or
hardware also tests opto-couplers, opto-
logic devices, SSOVP‟s, Sidacs, Diacs,